HCTS20MS
Radiation Hardened
Dual 4-Input NAND Gate
September 1995
Features
Pinouts
14 LEAD CERAMIC DUAL-IN-LINE METAL SEAL
PACKAGE (SBDIP) MIL-STD-183S CDIP2-T14
TOP VIEW
• 3 Micron Radiation Hardened SOS CMOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm2/mg
A1
B1
1
2
3
4
5
6
7
14 VCC
13 D2
12 C2
11 NC
10 B2
• Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day
(Typ)
NC
C1
• Dose Rate Survivability: >1 x 1012 RAD (Si)/s
• Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse
• Latch-Up Free Under Any Conditions
D1
Y1
9
8
A2
Y2
• Military Temperature Range: -55oC to +125oC
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
GND
14 LEAD CERAMIC METAL SEAL FLATPACK PACKAGE
(FLATPACK) MIL-STD-183S CDFP3-F14
TOP VIEW
• LSTTL Input Compatibility
- VIL = 0.8V Max
A1
B1
1
2
3
4
5
6
7
14
13
12
11
10
9
VCC
D2
- VIH = VCC/2 Min
NC
C1
C2
• Input Current Levels Ii ≤ 5µA at VOL, VOH
NC
B2
D1
Description
Y1
A2
The Intersil HCTS20MS is a Radiation Hardened Dual 4-Input
NAND Gate. A low on any input forces the output to a High state.
GND
8
Y2
The HCTS20MS utilizes advanced CMOS/SOS technology to
achieve high-speed operation. This device is a member of radia-
tion hardened, high-speed, CMOS/SOS Logic Family.
Functional Diagram
An
The HCTS20MS is supplied in a 14 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
Bn
Cn
Dn
Ordering Information
Yn
PART
NUMBER
TEMPERATURE SCREENING
RANGE LEVEL
PACKAGE
o
o
HCTS20DMSR -55 C to +125 C Intersil Class
S Equivalent
14 Lead SBDIP
TRUTH TABLE
INPUTS
o
o
HCTS20KMSR -55 C to +125 C Intersil Class
S Equivalent
14 Lead Ceramic
Flatpack
OUTPUTS
o
An
L
Bn
Cn
X
Dn
X
Yn
H
H
H
H
L
HCTS20D/
Sample
+25 C
Sample
Sample
Die
14 Lead SBDIP
X
L
o
X
X
X
HCTS20K/
Sample
+25 C
14 Lead Ceramic
Flatpack
X
X
X
H
L
X
X
X
L
o
HCTS20HMSR
+25 C
Die
H
H
H
NOTE: L = Logic Level Low, H = Logic level High, X = Don’t Care
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
Spec Number 518619
File Number 3051.1
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