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HCTS21D/SAMPLE PDF预览

HCTS21D/SAMPLE

更新时间: 2024-11-02 19:39:59
品牌 Logo 应用领域
瑞萨 - RENESAS 输入元件逻辑集成电路
页数 文件大小 规格书
8页 150K
描述
HCT SERIES, DUAL 4-INPUT AND GATE, CDIP14

HCTS21D/SAMPLE 技术参数

生命周期:Obsolete零件包装代码:DIP
包装说明:DIP,针数:14
Reach Compliance Code:unknownHTS代码:8542.39.00.01
风险等级:5.69系列:HCT
JESD-30 代码:R-CDIP-T14长度:19.43 mm
逻辑集成电路类型:AND GATE功能数量:2
输入次数:4端子数量:14
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装代码:DIP
封装形状:RECTANGULAR封装形式:IN-LINE
传播延迟(tpd):20 ns认证状态:Not Qualified
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:NO
技术:CMOS端子形式:THROUGH-HOLE
端子节距:2.54 mm端子位置:DUAL
宽度:2 mmBase Number Matches:1

HCTS21D/SAMPLE 数据手册

 浏览型号HCTS21D/SAMPLE的Datasheet PDF文件第2页浏览型号HCTS21D/SAMPLE的Datasheet PDF文件第3页浏览型号HCTS21D/SAMPLE的Datasheet PDF文件第4页浏览型号HCTS21D/SAMPLE的Datasheet PDF文件第5页浏览型号HCTS21D/SAMPLE的Datasheet PDF文件第6页浏览型号HCTS21D/SAMPLE的Datasheet PDF文件第7页 
HCTS21MS  
Radiation Hardened  
Dual 4-Input AND Gate  
October 1995  
Features  
Pinouts  
14 LEAD CERAMIC DUAL-IN-LINE  
METAL SEAL PACKAGE (SBDIP)  
MIL-STD-183S CDIP2-T14, LEAD FINISH C  
TOP VIEW  
• 3 Micron Radiation Hardened SOS CMOS  
• Total Dose 200K RAD (Si)  
• SEP Effective LET No Upsets: >100 MEV-cm2/mg  
• Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day  
(Typ)  
A1  
B1  
1
2
3
4
5
6
7
14 VCC  
13 D2  
12 C2  
11 NC  
10 B2  
• Dose Rate Survivability: >1 x 1012 RAD (Si)/s  
• Dose Rate Upset >1010 RAD(Si)/s 20ns Pulse  
• Latch-Up Free Under Any Conditions  
NC  
C1  
D1  
• Military Temperature Range: -55oC to +125oC  
• Significant Power Reduction Compared to LSTTL ICs  
• DC Operating Voltage Range: 4.5V to 5.5V  
Y1  
9
8
A2  
Y2  
GND  
14 LEAD CERAMIC METAL SEAL FLATPACK PACKAGE  
(FLATPACK) MIL-STD-183S CDFP3-F14, LEAD FINISH C  
TOP VIEW  
• LSTTL Input Compatibility  
- VIL = 0.8V Max  
A1  
B1  
1
2
3
4
5
6
7
14  
13  
12  
11  
10  
9
VCC  
D2  
- VIH = VCC/2 Min  
• Input Current Levels Ii 5µA at VOL, VOH  
NC  
C1  
C2  
NC  
B2  
D1  
Description  
Y1  
A2  
The Intersil HCTS21MS is a Radiation Hardened Dual Input AND  
Gate. A high on all inputs forces the output to a High state.  
GND  
8
Y2  
The HCTS21MS utilizes advanced CMOS/SOS technology to  
achieve high-speed operation. This device is a member of radia-  
tion hardened, high-speed, CMOS/SOS Logic Family.  
Functional Diagram  
An  
The HCTS21MS is supplied in a 14 lead Ceramic flatpack  
(K suffix) or a SBDIP Package (D suffix).  
Bn  
Cn  
Dn  
Yn  
Ordering Information  
PART  
NUMBER  
TEMPERATURE SCREENING  
RANGE LEVEL  
PACKAGE  
o
o
HCTS21DMSR -55 C to +125 C Intersil Class  
S Equivalent  
14 Lead SBDIP  
TRUTH TABLE  
INPUTS  
OUTPUTS  
o
o
HCTS21KMSR -55 C to +125 C Intersil Class  
S Equivalent  
14 Lead Ceramic  
Flatpack  
An  
L
Bn  
Cn  
X
Dn  
X
Yn  
L
X
L
o
HCTS21D/  
Sample  
+25 C  
Sample  
Sample  
Die  
14 Lead SBDIP  
X
X
X
L
X
X
X
H
L
X
L
o
HCTS21K/  
Sample  
+25 C  
14 Lead Ceramic  
Flatpack  
X
X
L
L
H
H
H
H
o
HCTS21HMSR  
+25 C  
Die  
NOTE: L = Logic Level Low, H = Logic level High, X = Don’t Care  
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.  
Spec Number 518618  
File Number 3053.1  
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999  
1

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