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FSPJ160R3 PDF预览

FSPJ160R3

更新时间: 2024-09-26 23:52:59
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页数 文件大小 规格书
7页 107K
描述
TRANSISTOR | MOSFET | N-CHANNEL | 100V V(BR)DSS | 70A I(D) | TO-254AA

FSPJ160R3 数据手册

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FSPJ160R, FSPJ160F  
Data Sheet  
December 2001  
Radiation Hardened, SEGR Resistant  
N-Channel Power MOSFETs  
Features  
• 70A (Current Limited by Package), 100V, r  
= 0.011  
DS(ON)  
Fairchild Star*Power Rad Hard  
MOSFETs have been specifically  
• UIS Rated  
TM  
Total Dose  
developed for high performance  
applications in a commercial or  
military space environment. Star*Power MOSFETs offer the  
- Meets Pre-RAD Specifications to 100 krad (Si)  
- Rated to 300 krad (Si)  
system designer both extremely low r  
and Gate  
DS(ON)  
• Single Event  
Charge allowing the development of low loss Power  
Subsystems. Star*Power FETs combine this electrical  
capability with total dose radiation hardness up to 300 krads  
while maintaining the guaranteed performance for Single  
Event Effects (SEE) which the Fairchild FS families have  
always featured.  
- Safe Operating Area Curve for Single Event Effects  
2
- SEE Immunity for LET of 36MeV/mg/cm with  
V
up to 100% of Rated Breakdown and  
of 5V Off-Bias  
DS  
V
GS  
• Dose Rate  
- Typically Survives 3E9 rad (Si)/s at 80% BV  
DSS  
The Fairchild portfolio of Star*Power FETs includes a family  
of devices in various voltage, current and package styles.  
The Star*Power family consists of Star*Power and  
- Typically Survives 2E12 if Current Limited to I  
AS  
• Photo Current  
Star*Power Gold products. Star*Power FETs are optimized  
- 9nA Per-rad (Si)/s Typically  
for total dose and r  
performance while exhibiting SEE  
DS(ON)  
• Neutron  
capability at full rated voltage up to an LET of 37. Star*Power  
Gold FETs have been optimized for SEE and Gate Charge  
providing SEE performance to 80% of the rated voltage for  
an LET of 82 with extremely low gate charge characteristics.  
- Maintain Pre-RAD Specifications  
for 3E13 Neutrons/cm  
2
2
- Usable to 3E14 Neutrons/cm  
Symbol  
This MOSFET is an enhancement-mode silicon-gate power  
field effect transistor of the vertical DMOS (VDMOS)  
structure. It is specifically designed and processed to be  
radiation tolerant. The MOSFET is well suited for  
applications exposed to radiation environments such as  
switching regulation, switching converters, power  
distribution, motor drives and relay drivers as well as other  
power control and conditioning applications. As with  
conventional MOSFETs these Radiation Hardened  
MOSFETs offer ease of voltage control, fast switching  
speeds and ability to parallel switching devices.  
D
G
S
Packaging  
TO-254AA  
G
S
D
Reliability screening is available as either TXV or Space  
equivalent of MIL-PRF-19500.  
Formerly available as type TA45213W.  
Ordering Information  
RAD LEVEL SCREENING LEVEL PART NUMBER/BRAND  
10K  
Engineering Samples FSPJ160D1  
CAUTION: Beryllia Warning per MIL-PRF-19500  
refer to package specifications.  
100K  
100K  
300K  
300K  
TXV  
Space  
TXV  
FSPJ160R3  
FSPJ160R4  
FSPJ160F3  
FSPJ160F4  
Space  
©2001 Fairchild Semiconductor Corporation  
FSPJ160R, FSPJ160F Rev. B  

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