August 2003
FGH40N6S2 / FGP40N6S2 / FGB40N6S2
600V, SMPS II Series N-Channel IGBT
General Description
Features
The FGH40N6S2, FGP40N6S2 and the FGB40N6S2 are
Low Gate Charge, Low Plateau Voltage SMPS II IGBTs
combining the fast switching speed of the SMPS IGBTs
along with lower gate charge, plateau voltage and ava-
lanche capability (UIS). These LGC devices shorten delay
times, and reduce the power requirement of the gate drive.
These devices are ideally suited for high voltage switched
mode power supply applications where low conduction
loss, fast switching times and UIS capability are essential.
SMPS II LGC devices have been specially designed for:
• 100kHz Operation at 390V, 24A
• 200kHZ Operation at 390V, 18A
• 600V Switching SOA Capability
o
• Typical Fall Time. . . . . . . . . . . 85ns at TJ = 125 C
• Low Gate Charge . . . . . . . . . 35nC at V = 15V
GE
• Low Plateau Voltage . . . . . . . . . . . . .6.5V Typical
• UIS Rated . . . . . . . . . . . . . . . . . . . . . . . . . 260mJ
• Low Conduction Loss
•
•
•
•
•
•
Power Factor Correction (PFC) circuits
Full bridge topologies
Half bridge topologies
Push-Pull circuits
Uninterruptible power supplies
Zero voltage and zero current switching circuits
IGBT (co-pack) formerly Developmental Type TA49438
Package
Symbol
TO-247
E
C
C
E
TO-220AB
C
G
G
TO-263AB
G
G
E
COLLECTOR
(Back-Metal)
E
COLLECTOR
(Flange)
Device Maximum Ratings T = 25°C unless otherwise noted
C
Symbol
BV
Parameter
Collector to Emitter Breakdown Voltage
Collector Current Continuous, T = 25°C
Ratings
Units
600
75
V
A
A
A
V
V
CES
I
C25
C
I
Collector Current Continuous, T = 110°C
35
C110
C
I
Collector Current Pulsed (Note 1)
Gate to Emitter Voltage Continuous
Gate to Emitter Voltage Pulsed
180
CM
V
±20
GES
GEM
V
±30
SSOA
Switching Safe Operating Area at T = 150°C, Figure 2
100A at 600V
260
J
E
Pulsed Avalanche Energy, I = 30A, L = 1mH, V = 50V
mJ
W
AS
CE
DD
P
Power Dissipation Total T = 25°C
290
D
C
Power Dissipation Derating T > 25°C
2.33
W/°C
°C
C
T
Operating Junction Temperature Range
Storage Junction Temperature Range
-55 to 150
-55 to 150
J
T
°C
STG
CAUTION: Stresses above those listed in “Device Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and
operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. Pulse width limited by maximum junction temperature.
©2003 Fairchild Semiconductor Corporation
FGH40N6S2 / FGP40N6S2 / FGB40N6S2 RevA5