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FDB045AN08A0-SN00005 PDF预览

FDB045AN08A0-SN00005

更新时间: 2024-11-14 21:21:43
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD /
页数 文件大小 规格书
11页 543K
描述
Power Field-Effect Transistor, N-Channel, Metal-oxide Semiconductor FET

FDB045AN08A0-SN00005 技术参数

生命周期:Obsolete包装说明:,
Reach Compliance Code:unknown风险等级:5.84
配置:Single最大漏极电流 (Abs) (ID):19 A
FET 技术:METAL-OXIDE SEMICONDUCTOR工作模式:ENHANCEMENT MODE
最高工作温度:175 °C极性/信道类型:N-CHANNEL
最大功率耗散 (Abs):310 W子类别:FET General Purpose Power
表面贴装:YESBase Number Matches:1

FDB045AN08A0-SN00005 数据手册

 浏览型号FDB045AN08A0-SN00005的Datasheet PDF文件第2页浏览型号FDB045AN08A0-SN00005的Datasheet PDF文件第3页浏览型号FDB045AN08A0-SN00005的Datasheet PDF文件第4页浏览型号FDB045AN08A0-SN00005的Datasheet PDF文件第5页浏览型号FDB045AN08A0-SN00005的Datasheet PDF文件第6页浏览型号FDB045AN08A0-SN00005的Datasheet PDF文件第7页 
May 2006  
tm  
FDB045AN08A0  
N-Channel PowerTrench MOSFET  
®
75V, 80A, 4.5mΩ  
Features  
Applications  
rDS(ON) = 3.9mΩ (Typ.), VGS = 10V, ID = 80A  
Qg(tot) = 92nC (Typ.), VGS = 10V  
Low Miller Charge  
42V Automotive Load Control  
Starter / Alternator Systems  
Electronic Power Steering Systems  
Electronic Valve Train Systems  
DC-DC converters and Off-line UPS  
Low QRR Body Diode  
UIS Capability (Single Pulse and Repetitive Pulse)  
Qualified to AEC Q101  
Distributed Power Architectures and VRMs  
Primary Switch for 24V and 48V systems  
Formerly developmental type 82684  
D
GATE  
G
DRAIN  
SOURCE  
(FLANGE)  
TO-263AB  
S
FDB SERIES  
MOSFET Maximum Ratings TC = 25°C unless otherwise noted  
Symbol  
VDSS  
VGS  
Parameter  
Ratings  
75  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current  
V
V
±20  
Continuous (TC < 137oC, VGS = 10V)  
Continuous (Tamb = 25oC, VGS = 10V, with RθJA = 43oC/W)  
Pulsed  
90  
19  
A
A
ID  
Figure 4  
600  
A
EAS  
Single Pulse Avalanche Energy (Note 1)  
mJ  
Power dissipation  
Derate above 25oC  
310  
W
PD  
2.0  
W/oC  
oC  
TJ, TSTG  
Operating and Storage Temperature  
-55 to 175  
Thermal Characteristics  
RθJC  
RθJA  
RθJA  
Thermal Resistance Junction to Case TO-263  
0.48  
62  
oC/W  
oC/W  
oC/W  
Thermal Resistance Junction to Ambient TO-263 (Note 2)  
Thermal Resistance Junction to Ambient TO-263, 1in2 copper pad area  
43  
This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For a  
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/  
Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.  
All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems  
certification.  
©2006 Fairchild Semiconductor Corporation  
FDB045AN08A0 Rev. A1  
www.fairchildsemi.com  

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