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DS26F32ME/883 PDF预览

DS26F32ME/883

更新时间: 2024-11-03 21:54:47
品牌 Logo 应用领域
美国国家半导体 - NSC 接口集成电路测试
页数 文件大小 规格书
12页 317K
描述
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A

DS26F32ME/883 数据手册

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MICROCIRCUIT DATA SHEET  
Original Creation Date: 05/20/99  
Last Update Date: 05/04/01  
Last Major Revision Date:  
MNDS26F32M-X-RH REV 0C0  
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE  
GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883,  
METHOD 1019.5, CONDITION A  
General Description  
The DS26F32 is a quad differential line receiver designed to meet the requirements of EIA  
Standards RS-422 and RS-423, and Federal Standards 1020 and 1030 for balanced and  
unbalanced digital data transmission.  
The DS26F32 offers improved performance due to the use of state-of-the-art L-FAST bipolar  
technology. The L-FAST technology allows for higher speeds and lower currents by utilizing  
extremely short gate delay times.  
The device features an input sensitivity of 200mV over the input common mode range of  
+7.0V. The DS26F32 provides an enable function common to all four receivers and TRI-STATE  
outputs with 8.0 mA sink capability. Also, a fail-safe input/output relationship keeps the  
outputs high when the inputs are open.  
The DS26F32 offers optimum performance when used with the DS26F31 Quad Differential Line  
Driver.  
Industry Part Number  
NS Part Numbers  
DS26F32  
DS26F32ME/883  
DS26F32MER-QML  
DS26F32MJ-QMLV  
DS26F32MJ/883  
DS26F32MJR-QML  
DS26F32MJRQMLV  
DS26F32MW-QMLV  
DS26F32MW/883  
DS26F32MWG/883  
DS26F32MWGRQMLV  
DS26F32MWR-QML  
DS26F32MWRQMLV  
Prime Die  
M632  
Controlling Document  
SEE FEATURES SECTION  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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