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DS26F32MEF-QML PDF预览

DS26F32MEF-QML

更新时间: 2024-11-24 21:21:59
品牌 Logo 应用领域
德州仪器 - TI 接口集成电路
页数 文件大小 规格书
11页 223K
描述
QUAD LINE RECEIVER, CQCC20, LCC-20

DS26F32MEF-QML 技术参数

生命周期:Obsolete包装说明:QCCN,
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8542.39.00.01风险等级:5.66
输入特性:DIFFERENTIAL SCHMITT TRIGGER接口集成电路类型:LINE RECEIVER
接口标准:EIA-422; EIA-423; FED STD 1020; FED STD 1030JESD-30 代码:S-CQCC-N20
长度:8.89 mm功能数量:4
端子数量:20最高工作温度:125 °C
最低工作温度:-55 °C封装主体材料:CERAMIC, METAL-SEALED COFIRED
封装代码:QCCN封装形状:SQUARE
封装形式:CHIP CARRIER认证状态:Not Qualified
最大接收延迟:31 ns接收器位数:4
筛选级别:MIL-STD-883座面最大高度:1.905 mm
最大供电电压:5.5 V最小供电电压:4.5 V
标称供电电压:5 V表面贴装:YES
技术:BIPOLAR温度等级:MILITARY
端子形式:NO LEAD端子节距:1.27 mm
端子位置:QUAD宽度:8.89 mm
Base Number Matches:1

DS26F32MEF-QML 数据手册

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MICROCIRCUIT DATA SHEET  
Original Creation Date: 05/20/99  
Last Update Date: 05/27/99  
Last Major Revision Date:  
MNDS26F32M-X-RH REV 0A0  
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE  
GUARANTEED TO 300K RAD(Si) TESTED TO MIL-STD-883,  
METHOD 1019.5, CONDITION A  
General Description  
The DS26F32 is a quad differential line receiver designed to meet the requirements of EIA  
Standards RS-422 and RS-423, and Federal Standards 1020 and 1030 for balanced and  
unbalanced digital data transmission.  
The DS26F32 offers improved performance due to the use of state-of-the-art L-FAST bipolar  
technology. The L-FAST technology allows for higher speeds and lower currents by utilizing  
extremely short gate delay times.  
The device features an input sensitivity of 200mV over the input common mode range of  
+7.0V. The DS26F32 provides an enable function common to all four receivers and TRI-STATE  
outputs with 8.0 mA sink capability. Also, a fail-safe input/output relationship keeps the  
outputs high when the inputs are open.  
The DS26F32 offers optimum performance when used with the DS26F31 Quad Differential Line  
Driver.  
Industry Part Number  
NS Part Numbers  
DS26F32  
DS26F32ME/883  
DS26F32MEF-QML  
DS26F32MJ-QMLV  
DS26F32MJ/883  
DS26F32MJF-QML  
DS26F32MJFQMLV  
DS26F32MW-QMLV  
DS26F32MW/883  
DS26F32MWF-QML  
DS26F32MWFQMLV  
Prime Die  
M632  
Controlling Document  
SEE FEATURES SECTION  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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