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CY7C1992CV18-250BZC PDF预览

CY7C1992CV18-250BZC

更新时间: 2024-11-30 06:51:47
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 存储内存集成电路静态存储器双倍数据速率时钟
页数 文件大小 规格书
30页 674K
描述
18-Mbit DDR-II SIO SRAM 2-Word Burst Architecture

CY7C1992CV18-250BZC 技术参数

是否Rohs认证:不符合生命周期:Obsolete
零件包装代码:BGA包装说明:13 X 15 MM, 1.40 MM HEIGHT, MO-216, FBGA-165
针数:165Reach Compliance Code:compliant
ECCN代码:3A991.B.2.AHTS代码:8542.32.00.41
风险等级:5.92Is Samacsys:N
最长访问时间:0.45 ns最大时钟频率 (fCLK):250 MHz
I/O 类型:SEPARATEJESD-30 代码:R-PBGA-B165
JESD-609代码:e0长度:15 mm
内存密度:18874368 bit内存集成电路类型:DDR SRAM
内存宽度:9功能数量:1
端子数量:165字数:2097152 words
字数代码:2000000工作模式:SYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:2MX9输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:LBGA
封装等效代码:BGA165,11X15,40封装形状:RECTANGULAR
封装形式:GRID ARRAY, LOW PROFILE并行/串行:PARALLEL
峰值回流温度(摄氏度):240电源:1.5/1.8,1.8 V
认证状态:Not Qualified座面最大高度:1.4 mm
最大待机电流:0.255 A最小待机电流:1.7 V
子类别:SRAMs最大压摆率:0.7 mA
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:TIN LEAD端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:30宽度:13 mm
Base Number Matches:1

CY7C1992CV18-250BZC 数据手册

 浏览型号CY7C1992CV18-250BZC的Datasheet PDF文件第2页浏览型号CY7C1992CV18-250BZC的Datasheet PDF文件第3页浏览型号CY7C1992CV18-250BZC的Datasheet PDF文件第4页浏览型号CY7C1992CV18-250BZC的Datasheet PDF文件第5页浏览型号CY7C1992CV18-250BZC的Datasheet PDF文件第6页浏览型号CY7C1992CV18-250BZC的Datasheet PDF文件第7页 
CY7C1392CV18, CY7C1992CV18  
CY7C1393CV18, CY7C1394CV18  
18-Mbit DDR-II SIO SRAM 2-Word  
Burst Architecture  
Features  
Functional Description  
18-Mbit density (2M x 8, 2M x 9, 1M x 18, 512K x 36)  
300 MHz clock for high bandwidth  
The CY7C1392CV18, CY7C1992CV18, CY7C1393CV18, and  
CY7C1394CV18 are 1.8V Synchronous Pipelined SRAMs,  
equipped with Double Data Rate Separate IO (DDR-II SIO)  
architecture. The DDR-II SIO consists of two separate ports: the  
read port and the write port to access the memory array. The  
read port has data outputs to support read operations and the  
write port has data inputs to support write operations. The DDR-II  
SIO has separate data inputs and data outputs to completely  
eliminate the need to “turn-around” the data bus required with  
common IO devices. Access to each port is accomplished  
through a common address bus. Addresses for read and write  
are latched on alternate rising edges of the input (K) clock. Write  
data is registered on the rising edges of both K and K. Read data  
is driven on the rising edges of C and C if provided, or on the  
rising edge of K and K if C/C are not provided. Each address  
location is associated with two 8-bit words in the case of  
CY7C1392CV18, two 9-bit words in the case of  
CY7C1992CV18, two 18-bit words in the case of  
CY7C1393CV18, and two 36-bit words in the case of  
CY7C1394CV18 that burst sequentially into or out of the device.  
2-word burst for reducing address bus frequency  
Double Data Rate (DDR) interfaces  
(data transferred at 600 MHz) at 300 MHz  
Two input clocks (K and K) for precise DDR timing  
SRAM uses rising edges only  
Two input clocks for output data (C and C) to minimize clock  
skew and flight time mismatches  
Echo clocks (CQ and CQ) simplify data capture in high-speed  
systems  
Synchronous internally self-timed writes  
DDR-II operates with 1.5 cycle read latency when the DLL is  
enabled  
Operates similar to a DDR-I device with 1 cycle read latency in  
DLL off mode  
1.8V core power supply with HSTL inputs and outputs  
Variable drive HSTL output buffers  
Asynchronous inputs include an output impedance matching  
input (ZQ). Synchronous data outputs are tightly matched to the  
two output echo clocks CQ/CQ, eliminating the need to capture  
data separately from each individual DDR-II SIO SRAM in the  
system design. Output data clocks (C/C) enable maximum  
system clocking and data synchronization flexibility.  
Expanded HSTL output voltage (1.4V–VDD  
)
Available in 165-Ball FBGA package (13 x 15 x 1.4 mm)  
Offered in both Pb-free and non Pb-free packages  
JTAG 1149.1 compatible test access port  
All synchronous inputs pass through input registers controlled by  
the K or K input clocks. All data outputs pass through output  
registers controlled by the C or C (or K or K in a single clock  
domain) input clocks. Writes are conducted with on-chip  
synchronous self-timed write circuitry.  
Delay Lock Loop (DLL) for accurate data placement  
Configurations  
CY7C1392CV18 – 2M x 8  
CY7C1992CV18 – 2M x 9  
CY7C1393CV18 – 1M x 18  
CY7C1394CV18 – 512K x 36  
Selection Guide  
Description  
300 MHz  
300  
278 MHz  
278  
250 MHz  
250  
200 MHz  
200  
167 MHz  
167  
Unit  
MHz  
mA  
Maximum Operating Frequency  
Maximum Operating Current  
x8  
x9  
820  
770  
700  
575  
485  
825  
775  
700  
575  
490  
x18  
x36  
865  
800  
725  
600  
500  
935  
850  
770  
630  
540  
Cypress Semiconductor Corporation  
Document #: 001-07162 Rev. *C  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised May 22, 2008  
[+] Feedback  

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