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CY7C1416BV18-300BZXC PDF预览

CY7C1416BV18-300BZXC

更新时间: 2024-11-01 05:19:27
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 静态存储器双倍数据速率
页数 文件大小 规格书
28页 1160K
描述
36-Mbit DDR-II SRAM 2-Word Burst Architecture

CY7C1416BV18-300BZXC 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Obsolete零件包装代码:BGA
包装说明:LBGA, BGA165,11X15,40针数:165
Reach Compliance Code:compliantECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.84
最长访问时间:0.45 ns其他特性:PIPELINED ARCHITECTURE
最大时钟频率 (fCLK):300 MHzI/O 类型:COMMON
JESD-30 代码:R-PBGA-B165JESD-609代码:e1
长度:17 mm内存密度:33554432 bit
内存集成电路类型:DDR SRAM内存宽度:8
湿度敏感等级:3功能数量:1
端子数量:165字数:4194304 words
字数代码:4000000工作模式:SYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:4MX8输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:LBGA
封装等效代码:BGA165,11X15,40封装形状:RECTANGULAR
封装形式:GRID ARRAY, LOW PROFILE并行/串行:PARALLEL
峰值回流温度(摄氏度):260电源:1.5/1.8,1.8 V
认证状态:Not Qualified座面最大高度:1.4 mm
最大待机电流:0.27 A最小待机电流:1.7 V
子类别:SRAMs最大压摆率:0.825 mA
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:Tin/Silver/Copper (Sn/Ag/Cu)端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:20宽度:15 mm

CY7C1416BV18-300BZXC 数据手册

 浏览型号CY7C1416BV18-300BZXC的Datasheet PDF文件第2页浏览型号CY7C1416BV18-300BZXC的Datasheet PDF文件第3页浏览型号CY7C1416BV18-300BZXC的Datasheet PDF文件第4页浏览型号CY7C1416BV18-300BZXC的Datasheet PDF文件第5页浏览型号CY7C1416BV18-300BZXC的Datasheet PDF文件第6页浏览型号CY7C1416BV18-300BZXC的Datasheet PDF文件第7页 
CY7C1416BV18  
CY7C1427BV18  
CY7C1418BV18  
CY7C1420BV18  
PRELIMINARY  
36-Mbit DDR-II SRAM 2-Word Burst  
Architecture  
Features  
Functional Description  
• 36-Mbit density (4M x 8, 4M x 9, 2M x 18, 1M x 36)  
• 300-MHz clock for high bandwidth  
The CY7C1416BV18, CY7C1427BV18, CY7C1418BV18 and  
CY7C1420BV18 are 1.8V Synchronous Pipelined SRAM  
equipped with DDR-II architecture. The DDR-II consists of an  
SRAM core with advanced synchronous peripheral circuitry  
and a 1-bit burst counter. Addresses for Read and Write are  
latched on alternate rising edges of the input (K) clock. Write  
data is registered on the rising edges of both K and K. Read  
data is driven on the rising edges of C and C if provided, or on  
the rising edge of K and K if C/C are not provided. Each  
address location is associated with two 8-bit words in the case  
of CY7C1416BV18 and two 9-bit words in the case of  
CY7C1427BV18 that burst sequentially into or out of the  
device. The burst counter always starts with a “0” internally in  
the case of CY7C1416BV18 and CY7C1427BV18. On  
CY7C1418BV18 and CY7C1420BV18, the burst counter  
takes in the least significant bit of the external address and  
bursts two 18-bit words in the case of CY7C1418BV18 and two  
36-bit words in the case of CY7C1420BV18 sequentially into  
or out of the device.  
• 2-Word burst for reducing address bus frequency  
• Double Data Rate (DDR) interfaces  
(data transferred at 600 MHz) @ 300 MHz for DDR-II  
• Two input clocks (K and K) for precise DDR timing  
— SRAM uses rising edges only  
• Two input clocks for output data (C and C) to minimize  
clock-skew and flight-time mismatches  
• Echo clocks (CQ and CQ) simplify data capture in  
high-speed systems  
• Synchronous internally self-timed writes  
• DDR-II operates with 1.5 cycle read latency when DLL  
is enabled  
• Operates like a DDR I device with 1 cycle read latency  
in DLL off mode  
Asynchronous inputs include output impedance matching  
input (ZQ). Synchronous data outputs (Q, sharing the same  
physical pins as the data inputs D) are tightly matched to the  
two output echo clocks CQ/CQ, eliminating the need for  
separately capturing data from each individual DDR SRAM in  
the system design. Output data clocks (C/C) enable maximum  
system clocking and data synchronization flexibility.  
• 1.8V core power supply with HSTL inputs and outputs  
• Variable drive HSTL output buffers  
• Expanded HSTL output voltage (1.4V–VDD  
)
• Available in 165-ball FBGA package (15 x 17 x 1.4 mm)  
• Offered in both in lead-free and non lead-free packages  
• JTAG 1149.1 compatible test access port  
All synchronous inputs pass through input registers controlled  
by the K or K input clocks. All data outputs pass through output  
registers controlled by the C or C (or K or K in a single clock  
domain) input clocks. Writes are conducted with on-chip  
synchronous self-timed write circuitry.  
• Delay Lock Loop (DLL) for accurate data placement  
Configurations  
CY7C1416BV18 – 4M x 8  
CY7C1427BV18 – 4M x 9  
CY7C1418BV18 – 2M x 18  
CY7C1420BV18 – 1M x 36  
Selection Guide  
300 MHz  
300  
278 MHz  
250 MHz  
250  
200 MHz  
200  
167 MHz  
167  
Unit  
MHz  
mA  
Maximum Operating Frequency  
278  
775  
Maximum Operating Current (DDR-II)  
825  
700  
600  
500  
Cypress Semiconductor Corporation  
Document Number: 001-07033 Rev. *B  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised September 20, 2006  
[+] Feedback  

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