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ꢏ ꢐꢏ ꢌꢅ ꢑꢒꢆ ꢈ ꢉ ꢌꢒꢓ ꢆ ꢒꢔꢕ ꢕ ꢍ ꢖꢗ ꢘꢖ ꢓ ꢅꢍ ꢖ
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SCBS777 − NOVEMBER 2003
D
D
D
D
D
Controlled Baseline
− One Assembly/Test Site, One Fabrication
Site
D
D
D
Flow-Through Architecture Optimizes PCB
Layout
Latch-Up Performance Exceeds 500 mA Per
JESD 17
Enhanced Diminishing Manufacturing
Sources (DMS) Support
ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
Enhanced Product-Change Notification
†
Qualification Pedigree
Member of the Texas Instruments
Widebus Family
DGG PACKAGE
(TOP VIEW)
D
State-of-the-Art Advanced BiCMOS
Technology (ABT) Design for 3.3-V
Operation and Low Static-Power
Dissipation
1
1OE
1Y1
1Y2
GND
1Y3
1Y4
48 2OE
47 1A1
46 1A2
45 GND
44 1A3
43 1A4
2
3
4
D
Supports Mixed-Mode Signal Operation
(5-V Input and Output Voltages With
5
6
3.3-V V
)
CC
7
V
42
V
D
D
D
D
Supports Unregulated Battery Operation
Down To 2.7 V
CC
CC
8
2Y1
2Y2
GND
2Y3
2Y4
3Y1
3Y2
GND
3Y3
3Y4
41 2A1
40 2A2
39 GND
38 2A3
37 2A4
36 3A1
35 3A2
34 GND
33 3A3
32 3A4
9
Typical V
<0.8 V at V
(Output Ground Bounce)
OLP
CC
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
= 3.3 V, T = 25°C
A
I
and Power-Up 3-State Support Hot
off
Insertion
Bus Hold on Data Inputs Eliminates the
Need for External Pullup/Pulldown
Resistors
D
Distributed V
High-Speed Switching Noise
and GND Pins Minimize
CC
V
31
30
V
CC
CC
†
Component qualification in accordance with JEDEC and industry
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification
testing should not be viewed as justifying use of this component
beyond specified performance and environmental limits.
4Y1
4Y2
GND
4Y3
4Y4
4A1
29 4A2
28 GND
27 4A3
26
25
4A4
3OE
4OE
description/ordering information
This 16-bit buffer/driver is designed specifically for low-voltage (3.3-V) V
provide a TTL interface to a 5-V system environment.
operation, but with the capability to
CC
The SN74LVTH16240 is designed specifically to improve both the performance and density of 3-state memory
address drivers, clock drivers, and bus-oriented receivers and transmitters.
The device can be used as four 4-bit buffers, two 8-bit buffers, or one 16-bit buffer. The device provides inverting
outputs and symmetrical active-low output-enable (OE) inputs.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus is a trademark of Texas Instruments.
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Copyright 2003, Texas Instruments Incorporated
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1
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