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SCBS778A − NOVEMBER 2003 − REVISED MARCH 2004
D
D
D
D
D
Controlled Baseline
− One Assembly/Test Site, One Fabrication
Site
D
D
D
Flow-Through Architecture Optimizes PCB
Layout
Latch-Up Performance Exceeds 500 mA Per
JESD 17
Enhanced Diminishing Manufacturing
Sources (DMS) Support
ESD Protection Exceeds JESD 22
− 2000-V Human-Body Model (A114-A)
− 200-V Machine Model (A115-A)
Enhanced Product-Change Notification
†
Qualification Pedigree
Member of the Texas Instruments
Widebus Family
DGG OR DL PACKAGE
(TOP VIEW)
D
State-of-the-Art Advanced BiCMOS
Technology (ABT) Design for 3.3-V
Operation and Low Static-Power
Dissipation
1
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
1OE
1Q1
1Q2
GND
1Q3
1Q4
1LE
1D1
1D2
GND
1D3
1D4
2
3
4
D
Supports Mixed-Mode Signal Operation
(5-V Input and Output Voltages With
5
6
3.3-V V
)
CC
7
V
V
CC
CC
D
D
D
D
Supports Unregulated Battery Operation
Down to 2.7 V
8
1Q5
1Q6
GND
1Q7
1Q8
2Q1
2Q2
GND
2Q3
2Q4
1D5
1D6
GND
1D7
1D8
2D1
2D2
GND
2D3
2D4
9
Typical V
<0.8 V at V
(Output Ground Bounce)
OLP
CC
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
= 3.3 V, T = 25°C
A
I
and Power-Up 3-State Support Hot
off
Insertion
Bus Hold on Data Inputs Eliminates the
Need for External Pullup/Pulldown
Resistors
D
Distributed V
High-Speed Switching Noise
and GND Pins Minimize
CC
V
V
CC
CC
†
2Q5
2Q6
GND
2Q7
2Q8
2OE
2D5
2D6
GND
2D7
2D8
2LE
Component qualification in accordance with JEDEC and industry
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification
testing should not be viewed as justifying use of this component
beyond specified performance and environmental limits.
description/ordering information
The SN74LVTH16373 is a 16-bit transparent D-type latch with 3-state outputs designed for low-voltage (3.3-V)
operation, but with the capability to provide a TTL interface to a 5-V system environment. This device is
V
CC
particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.
This device can be used as two 8-bit latches or one 16-bit latch. When the latch-enable (LE) input is high, the
Q outputs follow the data (D) inputs. When LE is taken low, the Q outputs are latched at the levels set up at the
D inputs.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus is a trademark of Texas Instruments.
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Copyright 2004, Texas Instruments Incorporated
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1
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