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CD4049UBMJ/883 PDF预览

CD4049UBMJ/883

更新时间: 2024-11-23 20:24:11
品牌 Logo 应用领域
德州仪器 - TI 输入元件逻辑集成电路触发器
页数 文件大小 规格书
8页 15K
描述
4000/14000/40000 SERIES, HEX 1-INPUT INVERT GATE, CDIP16

CD4049UBMJ/883 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:DIP, DIP16,.3Reach Compliance Code:unknown
HTS代码:8542.39.00.01风险等级:5.63
系列:4000/14000/40000JESD-30 代码:R-GDIP-T16
JESD-609代码:e0长度:19.43 mm
负载电容(CL):50 pF逻辑集成电路类型:INVERTER
功能数量:6输入次数:1
端子数量:16最高工作温度:125 °C
最低工作温度:-55 °C封装主体材料:CERAMIC, GLASS-SEALED
封装代码:DIP封装等效代码:DIP16,.3
封装形状:RECTANGULAR封装形式:IN-LINE
电源:3/15 VProp。Delay @ Nom-Sup:120 ns
传播延迟(tpd):120 ns认证状态:Not Qualified
施密特触发器:NO筛选级别:MIL-STD-883
座面最大高度:5.08 mm子类别:Gates
最大供电电压 (Vsup):15 V最小供电电压 (Vsup):3 V
标称供电电压 (Vsup):5 V表面贴装:NO
技术:CMOS温度等级:MILITARY
端子面层:Tin/Lead (Sn/Pb)端子形式:THROUGH-HOLE
端子节距:2.54 mm端子位置:DUAL
宽度:7.62 mmBase Number Matches:1

CD4049UBMJ/883 数据手册

 浏览型号CD4049UBMJ/883的Datasheet PDF文件第2页浏览型号CD4049UBMJ/883的Datasheet PDF文件第3页浏览型号CD4049UBMJ/883的Datasheet PDF文件第4页浏览型号CD4049UBMJ/883的Datasheet PDF文件第5页浏览型号CD4049UBMJ/883的Datasheet PDF文件第6页浏览型号CD4049UBMJ/883的Datasheet PDF文件第7页 
MICROCIRCUIT DATA SHEET  
Original Creation Date: 10/11/95  
Last Update Date: 07/17/98  
MNCD4049UBM-X REV 1A0  
Last Major Revision Date: 03/05/98  
HEX INVERTING BUFFER  
General Description  
These hex buffers are monolithic complementary MOS (CMOS) integrated circuits constructed  
with N- and P-channel enhancement mode transistors. These devices feature logic level  
conversion using only one supply voltage (Vdd). The input signal high level (Vih) can  
exceed the Vdd supply voltage when these devices are used for logic level conversions.  
These devices are intended for use as hex buffers, CMOS to DTL/TTL converters, or as CMOS  
current drivers, and at Vdd = 5.0V, they can drive directly two DTL/TTL loads over the  
full operating temperature range.  
Industry Part Number  
NS Part Numbers  
CD4049UBM  
CD4049UBMJ/883  
CD4049UBMW/883  
Prime Die  
CD4049UBM  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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