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AT29LV512-12JU PDF预览

AT29LV512-12JU

更新时间: 2024-09-20 06:38:19
品牌 Logo 应用领域
爱特美尔 - ATMEL /
页数 文件大小 规格书
15页 280K
描述
512K (64K x 8) 3-volt Only Flash Memory

AT29LV512-12JU 数据手册

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Features  
Single Supply Voltage, Range 3V to 3.6V  
3-volt Only Read and Write Operation  
Software Protected Programming  
Low-power Dissipation  
– 15 mA Active Current  
– 50 µA CMOS Standby Current  
Fast Read Access Time – 120 ns  
Sector Program Operation  
512K (64K x 8)  
3-volt Only  
Flash Memory  
– Single-cycle Reprogram (Erase and Program)  
– 512 Sectors (128 Bytes/Sector)  
– Internal Address and Data Latches for 128 Bytes  
Fast Sector Program Cycle Time – 20 ms Max  
Internal Program Control and Timer  
DATA Polling for End of Program Detection  
Typical Endurance > 10,000 Cycles  
CMOS and TTL Compatible Inputs and Outputs  
Green (Pb/Halide-free) Packaging Option  
AT29LV512  
1. Description  
The AT29LV512 is a 3-volt-only in-system Flash programmable erasable read-only  
memory (PEROM). Its 512K of memory is organized as 65,536 words by 8 bits. Man-  
ufactured with Atmel’s advanced nonvolatile CMOS technology, the device offers  
access times to 120 ns with power dissipation of just 54 mW over the industrial tem-  
perature range. When the device is deselected, the CMOS standby current is less  
than 50 µA. The device endurance is such that any sector can typically be written to in  
excess of 10,000 times.  
To allow for simple in-system reprogrammability, the AT29LV512 does not require  
high input voltages for programming. Three-volt-only commands determine the opera-  
tion of the device. Reading data out of the device is similar to reading from an  
EPROM. Reprogramming the AT29LV512 is performed on a sector basis; 128 bytes  
of data are loaded into the device and then simultaneously programmed.  
During a reprogram cycle, the address locations and 128 bytes of data are captured at  
microprocessor speed and internally latched, freeing the address and data bus for  
other operations. Following the initiation of a program cycle, the device will automati-  
cally erase the sector and then program the latched data using an internal control  
timer. The end of a program cycle can be detected by DATA polling of I/O7. Once the  
end of a program cycle has been detected, a new access for a read or program can  
begin.  
0177O–FLASH–9/08  

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