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ADCLK944BCPZ-R7 PDF预览

ADCLK944BCPZ-R7

更新时间: 2024-02-28 12:50:11
品牌 Logo 应用领域
亚德诺 - ADI 时钟驱动器逻辑集成电路PC
页数 文件大小 规格书
12页 217K
描述
2.5 V/3.3 V, Four LVPECL Outputs, SiGe Clock Fanout Buffer

ADCLK944BCPZ-R7 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:QFN
包装说明:HVQCCN,针数:16
Reach Compliance Code:unknown风险等级:5.74
Is Samacsys:N系列:2400
输入调节:DIFFERENTIALJESD-30 代码:S-PQCC-N16
JESD-609代码:e3长度:3 mm
逻辑集成电路类型:LOW SKEW CLOCK DRIVER湿度敏感等级:NOT APPLICABLE
功能数量:1反相输出次数:
端子数量:16实输出次数:4
最高工作温度:85 °C最低工作温度:-40 °C
封装主体材料:PLASTIC/EPOXY封装代码:HVQCCN
封装形状:SQUARE封装形式:CHIP CARRIER
峰值回流温度(摄氏度):260传播延迟(tpd):0.13 ns
认证状态:COMMERCIALSame Edge Skew-Max(tskwd):0.015 ns
座面最大高度:0.8 mm最大供电电压 (Vsup):3.63 V
最小供电电压 (Vsup):2.375 V标称供电电压 (Vsup):2.5 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子面层:MATTE TIN
端子形式:NO LEAD端子节距:0.5 mm
端子位置:QUAD处于峰值回流温度下的最长时间:40
宽度:3 mm最小 fmax:6200 MHz
Base Number Matches:1

ADCLK944BCPZ-R7 数据手册

 浏览型号ADCLK944BCPZ-R7的Datasheet PDF文件第2页浏览型号ADCLK944BCPZ-R7的Datasheet PDF文件第3页浏览型号ADCLK944BCPZ-R7的Datasheet PDF文件第4页浏览型号ADCLK944BCPZ-R7的Datasheet PDF文件第6页浏览型号ADCLK944BCPZ-R7的Datasheet PDF文件第7页浏览型号ADCLK944BCPZ-R7的Datasheet PDF文件第8页 
ADCLK944  
ABSOLUTE MAXIMUM RATINGS  
DETERMINING JUNCTION TEMPERATURE  
Table 4.  
To determine the junction temperature on the application  
printed circuit board (PCB), use the following equation:  
Parameter  
Rating  
Supply Voltage  
VCC − VEE  
Input Voltage  
CLK, CLK  
6.0 V  
TJ = TCASE + (ΨJT × PD)  
where:  
VEE − 0.5 V to VCC + 0.5 V  
TJ is the junction temperature (°C).  
CLK to CLK  
1.8 V  
2 V  
T
CASE is the case temperature (°C) measured by the customer at  
the top center of the package.  
JT is as indicated in Table 5.  
Input Termination, VT to CLK, CLK  
Input Current, CLK, CLK to VT Pin  
(CML, LVPECL Termination)  
Maximum Voltage on Output Pins  
Maximum Output Current  
Voltage Reference (VREF  
Operating Temperature  
Ambient Range  
40 mA  
Ψ
PD is the power dissipation.  
VCC + 0.5 V  
35 mA  
VCC to VEE  
Values of θJA are provided for package comparison and PCB  
design considerations. θJA can be used for a first-order approx-  
imation of TJ using the following equation:  
)
−40°C to +85°C  
150°C  
−65°C to +150°C  
TJ = TA + (θJA × PD)  
Junction  
Storage Temperature Range  
where TA is the ambient temperature (°C).  
Values of θJB are provided in Table 5 for package comparison  
and PCB design considerations.  
Stresses above those listed under Absolute Maximum Ratings  
may cause permanent damage to the device. This is a stress  
rating only; functional operation of the device at these or any  
other conditions above those indicated in the operational  
section of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect  
device reliability.  
ESD CAUTION  
THERMAL PERFORMANCE  
Table 5.  
Parameter  
Symbol  
Description  
Value1  
Unit  
Junction-to-Ambient Thermal Resistance  
Still Air  
0.0 m/sec Airflow  
Moving Air  
θJA  
Per JEDEC JESD51-2  
Per JEDEC JESD51-6  
ꢀ8  
°C/W  
θJMA  
1.0 m/sec Airflow  
2.5 m/sec Airflow  
68  
61  
°C/W  
°C/W  
Junction-to-Board Thermal Resistance  
Moving Air  
θJB  
θJC  
ΨJT  
Per JEDEC JESD51-8  
1.0 m/sec Airflow  
49  
°C/W  
°C/W  
°C/W  
Junction-to-Case Thermal Resistance (Die-to-Heat Sink)  
Still Air  
Per MIL-STD-883, Method 1012.1  
0.0 m/sec Airflow  
1.5  
Junction-to-Top-of-Package Characterization Parameter  
Still Air  
Per JEDEC JESD51-2  
0.0 m/sec Airflow  
2.0  
1 Results are from simulations. The PCB is a JEDEC multilayer type. Thermal performance for actual applications requires careful inspection of the conditions in the  
application to determine whether they are similar to those assumed in these calculations.  
Rev. 0 | Page 5 of 12  
 
 
 

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