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ADATE302-02BSVZ PDF预览

ADATE302-02BSVZ

更新时间: 2024-02-27 21:52:13
品牌 Logo 应用领域
亚德诺 - ADI /
页数 文件大小 规格书
59页 1139K
描述
500 MHz Dual Integrated DCL

ADATE302-02BSVZ 数据手册

 浏览型号ADATE302-02BSVZ的Datasheet PDF文件第2页浏览型号ADATE302-02BSVZ的Datasheet PDF文件第3页浏览型号ADATE302-02BSVZ的Datasheet PDF文件第4页浏览型号ADATE302-02BSVZ的Datasheet PDF文件第5页浏览型号ADATE302-02BSVZ的Datasheet PDF文件第6页浏览型号ADATE302-02BSVZ的Datasheet PDF文件第7页 
500 MHz Dual Integrated DCL with Differential  
Drive/Receive, Level Setting DACs, and Per Pin PMU  
ADATE302-02  
FEATURES  
GENERAL DESCRIPTION  
Driver  
The ADATE302-02 is a complete, single-chip solution that  
3-level driver with high-Z mode and built-in clamps  
Precision trimmed output resistance  
Low leakage mode (typically <10 nA)  
Voltage range: −2.0 V to +6.0 V  
1.0 ns minimum pulse width, 1 V terminated  
Comparator  
Window and differential comparator  
>1 GHz input equivalent bandwidth  
Load  
performs the pin electronic functions of the driver, the compa-  
rator, and the active load (DCL), per pin PMU, and dc levels for  
ATE applications. The device also contains an HVOUT driver  
with a VHH buffer capable of generating up to 13.5 V.  
The driver features three active states: data high mode, data low  
mode, and term mode, as well as an inhibit state. The inhibit  
state, in conjunction with the integrated dynamic clamp, facilitates  
the implementation of a high speed active termination. The output  
voltage range is −2.0 V to +6.0 V to accommodate a wide  
variety of test devices.  
12 mA maximum current capability  
Per pin PMU  
Force voltage range: −2.0 V to +6.0 V  
5 current ranges: 25 mA, 2 mA, 200 μA, 20 μA, and 2 μA  
Levels  
14-bit DAC for DCL levels  
Typically < 5 mV INL (calibrated)  
16-bit DAC for PMU levels  
Typically < 1.5 mV INL (calibrated) linearity in FV mode  
HVOUT output buffer  
0 V to 13.5 V output range  
The ADATE302-02 can be used as either a dual single-ended  
drive/receive channel or a single differential drive/receive  
channel. Each channel of the ADATE302-02 features a high  
speed window comparator for functional testing as well as a per  
pin PMU with FV or FI and MV or MI functions. All necessary  
dc levels for DCL functions are generated by on-chip 14-bit  
DACs. The per pin PMU features an on-chip 16-bit DAC for  
high accuracy and contains integrated range resistors to  
minimize external component counts.  
Packages  
84-ball, 9 mm × 9 mm, flip-chip BGA  
100-lead TQFP_EP  
1.7 W per channel with no load  
The ADATE302-02 uses a serial bus to program all functional  
blocks and has an on-board temperature sensor for monitoring  
the device temperature.  
APPLICATIONS  
Automatic test equipment  
Semiconductor test systems  
Board test systems  
Instrumentation and characterization equipment  
Rev. A  
Information furnished by Analog Devices is believed to be accurate and reliable. However, no  
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other  
rights of third parties that may result from its use. Specifications subject to change without notice. No  
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.  
Trademarks and registeredtrademarks are theproperty of their respective owners.  
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.  
Tel: 781.329.4700  
www.analog.com  
Fax: 781.461.3113 ©2008–2009 Analog Devices, Inc. All rights reserved.  
 

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