500 MHz Dual Integrated DCL with Differential
Drive/Receive, Level Setting DACs, and Per Pin PMU
ADATE302-02
FEATURES
GENERAL DESCRIPTION
Driver
The ADATE302-02 is a complete, single-chip solution that
3-level driver with high-Z mode and built-in clamps
Precision trimmed output resistance
Low leakage mode (typically <10 nA)
Voltage range: −2.0 V to +6.0 V
1.0 ns minimum pulse width, 1 V terminated
Comparator
Window and differential comparator
>1 GHz input equivalent bandwidth
Load
performs the pin electronic functions of the driver, the compa-
rator, and the active load (DCL), per pin PMU, and dc levels for
ATE applications. The device also contains an HVOUT driver
with a VHH buffer capable of generating up to 13.5 V.
The driver features three active states: data high mode, data low
mode, and term mode, as well as an inhibit state. The inhibit
state, in conjunction with the integrated dynamic clamp, facilitates
the implementation of a high speed active termination. The output
voltage range is −2.0 V to +6.0 V to accommodate a wide
variety of test devices.
12 mA maximum current capability
Per pin PMU
Force voltage range: −2.0 V to +6.0 V
5 current ranges: 25 mA, 2 mA, 200 μA, 20 μA, and 2 μA
Levels
14-bit DAC for DCL levels
Typically < 5 mV INL (calibrated)
16-bit DAC for PMU levels
Typically < 1.5 mV INL (calibrated) linearity in FV mode
HVOUT output buffer
0 V to 13.5 V output range
The ADATE302-02 can be used as either a dual single-ended
drive/receive channel or a single differential drive/receive
channel. Each channel of the ADATE302-02 features a high
speed window comparator for functional testing as well as a per
pin PMU with FV or FI and MV or MI functions. All necessary
dc levels for DCL functions are generated by on-chip 14-bit
DACs. The per pin PMU features an on-chip 16-bit DAC for
high accuracy and contains integrated range resistors to
minimize external component counts.
Packages
84-ball, 9 mm × 9 mm, flip-chip BGA
100-lead TQFP_EP
1.7 W per channel with no load
The ADATE302-02 uses a serial bus to program all functional
blocks and has an on-board temperature sensor for monitoring
the device temperature.
APPLICATIONS
Automatic test equipment
Semiconductor test systems
Board test systems
Instrumentation and characterization equipment
Rev. A
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