Data Sheet
ADATE324
1.6 GHz Quad Integrated DCL with VHH Drive Capability, Level Setting DACs, and
On-Chip Calibration Registers
FEATURES
GENERAL DESCRIPTION
► 2 selectable data rates up to 1.6 GHz or 3.2 Gbps maximum
toggle rate
The ADATE324 is a complete, single-chip, quad-channel automatic
test equipment (ATE) solution that performs the pin electronics
(PE) functions of a driver, a comparator, and an active load (DCL).
The device also features a high voltage (VHH) drive capability
per chip to support flash memory testing applications. Dedicated
16-bit digital-to-analog converters (DACs) with on-chip calibration
registers provide all the necessary dc levels for operation of the
device.
► DCL disable mode (low leakage typically <10 nA)
► Power and speed programmable (driver and comparators active)
► 1.025 W power dissipation per channel low speed (Case A)
► 1.125 W power dissipation per channel high speed (Case B)
► Voltage driver
► 3-level driver with high-Z and reflection clamps
► Voltage range: –1.5 V to +4.5 V (+5 V extended range)
► Precision trimmed output resistance
► Functional amplitude (VIH – VIL): 0.05 V minimum to 6.0 V
maximum
► 312.5 ps minimum pulse width (1.0 V programmed swing)
► 26 ps deterministic jitter and 1.4 ps random jitter
► Comparator
► Differential and single-ended window modes
► Input voltage range: –1.5 V to +4.5 V (+5 V extended range)
The voltage driver features three active states: high, low, and termi-
nate mode, as well as a high impedance inhibit state. The inhibit
state, in conjunction with the integrated dynamic clamps, facilitates
significant attenuation of transmission line reflections when the
driver is not actively terminating the line. The open circuit drive
capability is −1.5 V to +4.5 V to accommodate the standard range
of ATE and instrumentation applications.
The ADATE324 can be used as a quad, single-ended, pin electron-
ics channel or as a dual differential channel. In additional to per
channel, high speed window comparators, the ADATE324 provides
two programmable threshold differential comparators for differential
ATE applications.
► 130 ps ERT/EFT normal window comparator 1.0 V,
terminated
► Active load: ±12 mA current range
► VHH drive
► Dedicated VHH output pin
► Voltage range: 0.0 V to 13.5 V
► DC levels
► Fully integrated and dedicated 16-bit DACs
► On-chip gain and offset calibration registers with automatic
add and multiply functions
All dc levels for DCL functions are generated by dedicated on-
chip 16-bit DACs. To facilitate accurate programming levels, the
ADATE324 also includes an integrated calibration function to cor-
rect for gain and offset errors of each functional block. Correction
coefficients can be stored on chip, and any values written to the
DACs are automatically adjusted using the appropriate correction
factors.
The ADATE324 uses a serial programmable interface (SPI) bus
to program all functional blocks, DACs, and on-chip calibration
constants. The device also has an on-chip temperature sensor,
and overvoltage and undervoltage fault clamps, for monitoring and
reporting the device temperature, and any output pin voltage faults
that may occur during operation.
► Package: 9 mm × 9 mm, 121-ball chip scale package ball grid
array [CSP_BGA]
APPLICATIONS
► ATE
► Semiconductor and board test systems
► Instrumentation and characterization equipment
For more information on the ADATE324, contact ADATE324@analog.com.
Rev. Sp0
Information furnished by Analog Devices is believed to be accurate and reliable "as is". However, no responsibility is assumed by Analog
Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to
change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
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