9ZXL0831
8-OUTPUT DB800ZL
Absolute Maximum Ratings
Stresses above the ratings listed below can cause permanent damage to the 9ZXL0831. These ratings, which are standard
values for IDT commercially rated parts, are stress ratings only. Functional operation of the device at these or any other
conditions above those indicated in the operational sections of the specifications is not implied. Exposure to absolute
maximum rating conditions for extended periods can affect product reliability. Electrical parameters are guaranteed only over
the recommended operating temperature range.
PARAMETER
SYMBOL
CONDITIONS
UNITS NOTES
MIN
TYP
MAX
4.6
VDD, VDDA,
VDDR
3.3V Supply Voltage
VDD for core logic and PLL
V
1,2
Input Low Voltage
Input High Voltage
Input High Voltage
VIL
GND-0.5
V
V
V
°C
°C
V
1
1
1
VIH
Except for SMBus interface
SMBus clock and data pins
VDD+0.5V
5.5V
VIHSMB
1
1
1
Storage Temperature
Junction Temperature
Input ESD protection
Ts
Tj
ESD prot
-65
150
125
Human Body Model
2000
1Guaranteed by design and characterization, not 100% tested in production.
2 Operation under these conditions is neither implied nor guaranteed.
Electrical Characteristics–DIF_IN Clock Input Parameters (HCSL-compatible)
TA = TCOM; Supply Voltage VDD = 3.3 V +/-5%
PARAMETER
SYMBOL
VCROSS
CONDITIONS
MIN
150
TYP
MAX
900
UNITS NOTES
Input Crossover Voltage -
DIF_IN
Cross Over Voltage
mV
1
Input Swing - DIF_IN
Input Slew Rate - DIF_IN
Input Leakage Current
Input Duty Cycle
VSWING
dv/dt
IIN
Differential value
Measured differentially
300
0.4
-5
mV
V/ns
uA
1
8
5
1,2
VIN = VDD , VIN = GND
dtin
Measurement from differential wavefrom
45
0
55
125
%
1
1
Input Jitter - Cycle to Cycle
JDIFIn
Differential Measurement
ps
1 Guaranteed by design and characterization, not 100% tested in production.
2Slew rate measured through +/-75mV window centered around differential zero
IDT® 8-OUTPUT DB800ZL
5
9ZXL0831
REV E 081616