Datasheet > 74AHC74-Q100

74AHC74-Q100

更新时间： 2024-09-17 02:56:59

品牌	Logo	应用领域
安世 - NEXPERIA		逻辑集成电路
页数	文件大小	规格书
19页	752K
描述
Dual D-type flip-flop with set and reset positive-edge trigger

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74AHC74-Q100 数据手册

74AHC74-Q100;

74AHCT74-Q100

Dual D-type flip-flop with set and reset; positive-edge trigger

Rev. 2 — 21 April 2015

Product data sheet

1. General description

The 74AHC74-Q100; 74AHCT74-Q100 is a high-speed Si-gate CMOS device and is pin

compatible with Low-Power Schottky TTL (LSTTL). It is specified in compliance with

JEDEC standard No. 7-A.

The 74AHC74-Q100; 74AHCT74-Q100 is a dual positive-edge triggered, D-type flip-flop

with individual data inputs (D), clock inputs (CP), set inputs (SD) and reset inputs (RD). It

also has complementary outputs (Q and Q).

The set and reset are asynchronous active LOW inputs that operate independent of the

clock input. Information on the data input is transferred to the Q output on the LOW to

HIGH transition of the clock pulse. The data inputs must be stable one set-up time prior to

the LOW to HIGH clock transition for predictable operation.

Schmitt-trigger action in the clock input makes the circuit highly tolerant to slower clock

rise and fall times.

This product has been qualified to the Automotive Electronics Council (AEC) standard

Q100 (Grade 1) and is suitable for use in automotive applications.

2. Features and benefits

 Automotive product qualification in accordance with AEC-Q100 (Grade 1)

 Specified from 40 C to +85 C and from 40 C to +125 C

 Balanced propagation delays

 All inputs have Schmitt-trigger actions

 Inputs accept voltages higher than V_CC

 Input levels:

 For 74AHC74-Q100: CMOS level

 For 74AHCT74-Q100: TTL level

 ESD protection:

 MIL-STD-883, method 3015 exceeds 2000 V

 HBM JESD22-A114F exceeds 2000 V

 MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 )

 Multiple package options

12 3 4 5 6 7...19

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