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70V914S12PF PDF预览

70V914S12PF

更新时间: 2024-02-21 21:55:28
品牌 Logo 应用领域
艾迪悌 - IDT 静态存储器内存集成电路
页数 文件大小 规格书
10页 108K
描述
TQFP-80, Tray

70V914S12PF 技术参数

是否无铅:不含铅是否Rohs认证:符合
生命周期:Obsolete零件包装代码:QFP
包装说明:14 X 14MM, 1.40 MM HEIGHT, TQFP-80针数:80
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.32.00.41风险等级:5.84
Is Samacsys:N最长访问时间:25 ns
JESD-30 代码:S-PQFP-G80JESD-609代码:e3
长度:14 mm内存密度:36864 bit
内存集成电路类型:DUAL-PORT SRAM内存宽度:9
湿度敏感等级:3功能数量:1
端子数量:80字数:4096 words
字数代码:4000工作模式:SYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:4KX9封装主体材料:PLASTIC/EPOXY
封装代码:LQFP封装形状:SQUARE
封装形式:FLATPACK, LOW PROFILE并行/串行:PARALLEL
峰值回流温度(摄氏度):260认证状态:Not Qualified
座面最大高度:1.6 mm最大供电电压 (Vsup):3.6 V
最小供电电压 (Vsup):3 V标称供电电压 (Vsup):3.3 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子面层:MATTE TIN
端子形式:GULL WING端子节距:0.65 mm
端子位置:QUAD处于峰值回流温度下的最长时间:30
宽度:14 mmBase Number Matches:1

70V914S12PF 数据手册

 浏览型号70V914S12PF的Datasheet PDF文件第4页浏览型号70V914S12PF的Datasheet PDF文件第5页浏览型号70V914S12PF的Datasheet PDF文件第6页浏览型号70V914S12PF的Datasheet PDF文件第7页浏览型号70V914S12PF的Datasheet PDF文件第8页浏览型号70V914S12PF的Datasheet PDF文件第10页 
IDT70V914S  
High-Speed 3.3V (4K x 9) Synchronous Dual-Port Static RAM  
Industrial and Commercial Temperature Ranges  
FunctionalDescription  
transitionsoftheclocksignalallowingtheshortestpossiblerealizedcycle  
times.Clockenableinputsareprovidedtostalltheoperationoftheaddress  
and data input registers without introducing clock skew for very fast  
interleavedmemoryapplications.  
A HIGH on the CE input for one clock cycle will power down the  
internalcircuitrytoreducestaticpowerconsumption.  
TheIDT70V914providesatruesynchronousDual-PortStaticRAM  
interface.Registeredinputsprovideveryshortset-upandholdtimeson  
address,data,andallcriticalcontrolinputs.Allinternalregistersareclocked  
ontherisingedgeoftheclock signal.Anasynchronousoutputenableis  
providedtoeaseasynchronousbusinterfacing.  
The internal write pulse width is dependent on the LOW to HIGH  
Truth Table I: Read/Write Control(1)  
Inputs  
Outputs  
Synchronous(3)  
Asynchronous  
Mode  
CLK  
R/W  
I/O0-8  
High-Z  
DATAIN  
DATAOUT  
High-Z  
CE  
H
L
OE  
X
X
L
X
L
Deselected, Power-Down  
Selected and Write Enabled  
Read Selected and Data Output Enable Read  
Outputs Disabled  
L
H
X
X
H
5616 tbl 09  
Truth Table II: Clock Enable Function Table(1)  
Inputs  
Register Inputs  
Register Outputs(4)  
ADDR DATAOUT  
(3)  
CLKEN(2)  
Mode  
CLK  
ADDR  
H
DATAIN  
Load "1"  
Load "0"  
L
L
H
L
H
L
H
L
X
L
H
H
X
X
X
NC  
NC  
NC  
NC  
Hold (do nothing)  
X
5616 tbl 10  
NOTES:  
1. 'H' = HIGH voltage level steady state, 'h' = HIGH voltage level one set-up time prior to the LOW-to-HIGH clock transition, 'L' = LOW voltage level steady state 'l' = LOW  
voltage level one set-up time prior to the LOW-to-HIGH clock transition, 'X' = Don't care, 'NC' = No change  
2. CLKEN = VIL must be clocked in during Power-Up.  
3. Control signals are initialted and terminated on the rising edge of the CLK, depending on their input level. When R/W and CE are LOW, a write cycle is initiated on  
the LOW-to-HIGH transition of the CLK. Termination of a write cycle is done on the next LOW-to-HIGH transistion of the CLK.  
4. The register outputs are internal signals from the register inputs being clocked in or disabled by CLKEN.  
6.492  

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