TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions
Group A
Subgroups
Device
type
Limits
Units
-55°C ≤ TC ≤ +125°C
4.5 V ≤ VCC ≤ 5.5 V
unless otherwise specified
Min
Max
300
Operating supply
current 1/
ICC1
1, 2, 3
1, 2, 3
All
All
mA
mA
all I/O's = 0 mA, WE , CE = VIL
VCC standby
current (TTL)
ICC2
60
CE = VIH, VIN < VIL
VIN > VIH
VCC standby
current (CMOS)
ICC3
1, 2, 3
1, 2, 3
01-03
04-06
25
10
mA
V
CE > VCC-0.2 V
VIN > VCC-0.2 V or VIN < 0.2 V
Data retention
voltage
VDR
-2.0
CE > VCC-0.2 V,
VIN > VCC-0.2 V or VIN < 0.2 V
04-06
Data retention
current
ICCDR
VCC = 2.0 V
VIN = 0.0 V to VCC
VI/O = 0.0 V to VCC
IOH = -4.0 mA
2.0
mA
µA
µA
V
Input leakage
current (low)
IILK
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
4
All
All
All
All
All
All
-10
-10
+10
+10
Output leakage
current (high)
IOLK
VOH
VOL
CIN
High level output
voltage
2.4
Low level output
voltage
IOL = 6.0 mA
0.4
12
14
V
Input capacitance
pF
pF
VIN = 0 V, TA = 25°C,
f = 1.0 MHz, see 4.4.1e
Input/output
capacitance
CI/O
4
VOUT = 0 V, TA = 25°C,
f = 1.0 MHz, see 4.4.1e
Functional tests
Read cycle time
See 4.4.1c
7, 8A, 8B
All
tAVAV
See figures 4 and 5 as applicable 9, 10, 11
2/ 3/
01,04
02,05
03,06
35
25
20
ns
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-96795
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
C
SHEET
6
DSCC FORM 2234
APR 97