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54AC2708DMQB PDF预览

54AC2708DMQB

更新时间: 2024-11-21 20:33:11
品牌 Logo 应用领域
德州仪器 - TI 时钟先进先出芯片内存集成电路
页数 文件大小 规格书
14页 31K
描述
64X9 OTHER FIFO, CDIP28

54AC2708DMQB 技术参数

生命周期:Obsolete包装说明:DIP, DIP28,.6
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8542.32.00.71风险等级:5.84
最大时钟频率 (fCLK):20 MHzJESD-30 代码:R-GDIP-T28
内存密度:576 bit内存集成电路类型:OTHER FIFO
内存宽度:9功能数量:1
端子数量:28字数:64 words
字数代码:64工作模式:SYNCHRONOUS/ASYNCHRONOUS
最高工作温度:125 °C最低工作温度:-55 °C
组织:64X9输出特性:3-STATE
可输出:YES封装主体材料:CERAMIC, GLASS-SEALED
封装代码:DIP封装等效代码:DIP28,.6
封装形状:RECTANGULAR封装形式:IN-LINE
并行/串行:PARALLEL电源:3.3/5 V
认证状态:Not Qualified筛选级别:38535Q/M;38534H;883B
座面最大高度:5.715 mm子类别:FIFOs
最大供电电压 (Vsup):6 V最小供电电压 (Vsup):2 V
标称供电电压 (Vsup):5 V表面贴装:NO
技术:CMOS温度等级:MILITARY
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL宽度:15.24 mm
Base Number Matches:1

54AC2708DMQB 数据手册

 浏览型号54AC2708DMQB的Datasheet PDF文件第2页浏览型号54AC2708DMQB的Datasheet PDF文件第3页浏览型号54AC2708DMQB的Datasheet PDF文件第4页浏览型号54AC2708DMQB的Datasheet PDF文件第5页浏览型号54AC2708DMQB的Datasheet PDF文件第6页浏览型号54AC2708DMQB的Datasheet PDF文件第7页 
MICROCIRCUIT DATA SHEET  
Original Creation Date: 07/01/96  
Last Update Date: 03/31/97  
MN54AC2708-X REV 2A0  
Last Major Revision Date: 02/13/97  
64 X 9 First-In, First-Out Memory  
General Description  
The AC2708 is an expandable first-In, first-out memory organized as 64 wordsby 9 bits. A  
50 MHz shift-in and 40 MHz shift-out typical data rate makes it ideal for high-speed  
applications. It uses a dual port RAM architecture with pointer logic to achieve the high  
speed with negligible fall-through time.  
Separate Shift-In (SI) and Shift-Out (SO) clocks control the use of synchronous or  
asynchronous write or read. Other controls include a Master Reset (MR) and Output Enable  
(OE) for intializing the internal registers and allowing the data outputs to be  
TRI-STATE. Input Ready (IR) and Output Ready (OR) signal when the FIFO is ready for I/O  
operations. The status flags HF and FULL indicated when the FIFO is full, empty or half  
full.  
The FIFO can be expanded to provide different word lengths by tying off unused data  
inputs.  
Industry Part Number  
NS Part Numbers  
54AC2708  
54AC2708DMQB  
54AC2708LMQB  
Prime Die  
Z2708  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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