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54AC273WG-QML/NOPB PDF预览

54AC273WG-QML/NOPB

更新时间: 2024-11-18 14:46:39
品牌 Logo 应用领域
德州仪器 - TI 输出元件逻辑集成电路触发器
页数 文件大小 规格书
10页 108K
描述
AC SERIES, POSITIVE EDGE TRIGGERED D FLIP-FLOP, TRUE OUTPUT, CDSO20, GULL WING, CERPACK-20

54AC273WG-QML/NOPB 技术参数

是否Rohs认证: 符合生命周期:Obsolete
包装说明:SOP,Reach Compliance Code:compliant
HTS代码:8542.39.00.01风险等级:5.56
系列:ACJESD-30 代码:R-GDSO-G20
逻辑集成电路类型:D FLIP-FLOP湿度敏感等级:1
位数:8功能数量:1
端子数量:20最高工作温度:125 °C
最低工作温度:-55 °C输出极性:TRUE
封装主体材料:CERAMIC, GLASS-SEALED封装代码:SOP
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
峰值回流温度(摄氏度):260传播延迟(tpd):16 ns
认证状态:Not Qualified筛选级别:MIL-PRF-38535
座面最大高度:2.59 mm最大供电电压 (Vsup):6 V
最小供电电压 (Vsup):2 V标称供电电压 (Vsup):3 V
表面贴装:YES技术:CMOS
温度等级:MILITARY端子形式:GULL WING
端子节距:1.27 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED触发器类型:POSITIVE EDGE
最小 fmax:95 MHzBase Number Matches:1

54AC273WG-QML/NOPB 数据手册

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MICROCIRCUIT DATA SHEET  
Original Creation Date: 07/01/96  
Last Update Date: 03/18/02  
MN54AC273-X REV 1C1  
Last Major Revision Date: 07/01/96  
Octal D Flip-Flop  
General Description  
The AC273 has eight edge-triggered D-type flip-flops with individual D inputs and Q  
outputs. The common buffered Clock (CP) and Master Reset (MR) inputs load and reset  
(clear) all flip-flops simultaneously.  
The register is fully edge-triggered. The state of each D input, one setup time before  
the LOW-to-HIGH clock transition, is transferred to the corresponding flip-flops' Q  
output.  
All outputs will be forced LOW independently of Clock or Data inputs by a LOW voltage  
level on the MR input. The device is useful for applications where the true output only  
is required and the Clock and Master Reset are common to all storage elements.  
Industry Part Number  
NS Part Numbers  
54AC273  
54AC273DMQB  
54AC273FMQB  
54AC273LMQB  
54AC273WG-QML  
Prime Die  
Z273  
Controlling Document  
SEE FEATURES SECTION  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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