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2SC3710A-Y PDF预览

2SC3710A-Y

更新时间: 2024-11-18 19:42:15
品牌 Logo 应用领域
东芝 - TOSHIBA 局域网开关晶体管
页数 文件大小 规格书
5页 145K
描述
TRANSISTOR 12 A, 80 V, NPN, Si, POWER TRANSISTOR, LEAD FREE, 2-10R1A, 3 PIN, BIP General Purpose Power

2SC3710A-Y 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:2-10R1A, 3 PIN针数:3
Reach Compliance Code:unknown风险等级:5.74
外壳连接:ISOLATED最大集电极电流 (IC):12 A
集电极-发射极最大电压:80 V配置:SINGLE
最小直流电流增益 (hFE):120JESD-30 代码:R-PSFM-T3
元件数量:1端子数量:3
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:FLANGE MOUNT
极性/信道类型:NPN认证状态:Not Qualified
表面贴装:NO端子形式:THROUGH-HOLE
端子位置:SINGLE晶体管应用:SWITCHING
晶体管元件材料:SILICON标称过渡频率 (fT):80 MHz
Base Number Matches:1

2SC3710A-Y 数据手册

 浏览型号2SC3710A-Y的Datasheet PDF文件第2页浏览型号2SC3710A-Y的Datasheet PDF文件第3页浏览型号2SC3710A-Y的Datasheet PDF文件第4页浏览型号2SC3710A-Y的Datasheet PDF文件第5页 
2SC3710A  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)  
2SC3710A  
High-Current Switching Applications  
Unit: mm  
Low collector saturation voltage: V  
= 0.4 V (max)  
CE (sat)  
High-speed switching: t  
= 1.0 μs (typ.)  
stg  
Complementary to 2SA1452A  
Absolute Maximum Ratings (Tc = 25°C)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
CBO  
V
CEO  
V
EBO  
80  
80  
6
V
V
V
A
A
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
I
12  
2
C
Base current  
I
B
Collector power dissipation  
(Tc = 25°C)  
P
30  
W
C
JEDEC  
Junction temperature  
Storage temperature range  
T
150  
°C  
°C  
j
JEITA  
T
stg  
55 to 150  
TOSHIBA  
2-10R1A  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
Weight: 1.7 g (typ.)  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are  
within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report  
and estimated failure rate, etc).  
1
2006-11-10  

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