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2SA2097(TE16L1,NQ) PDF预览

2SA2097(TE16L1,NQ)

更新时间: 2024-02-10 04:33:22
品牌 Logo 应用领域
东芝 - TOSHIBA 开关晶体管
页数 文件大小 规格书
5页 142K
描述
TRANSISTOR PNP 50V 5A SC-62

2SA2097(TE16L1,NQ) 技术参数

生命周期:Active包装说明:SMALL OUTLINE, R-PSSO-G2
Reach Compliance Code:unknownFactory Lead Time:18 weeks
风险等级:5.72外壳连接:COLLECTOR
最大集电极电流 (IC):5 A集电极-发射极最大电压:50 V
配置:SINGLE最小直流电流增益 (hFE):100
JESD-30 代码:R-PSSO-G2元件数量:1
端子数量:2封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
极性/信道类型:PNP表面贴装:YES
端子形式:GULL WING端子位置:SINGLE
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

2SA2097(TE16L1,NQ) 数据手册

 浏览型号2SA2097(TE16L1,NQ)的Datasheet PDF文件第2页浏览型号2SA2097(TE16L1,NQ)的Datasheet PDF文件第3页浏览型号2SA2097(TE16L1,NQ)的Datasheet PDF文件第4页浏览型号2SA2097(TE16L1,NQ)的Datasheet PDF文件第5页 
2SA2097  
TOSHIBA Transistor Silicon PNP Epitaxial Type  
2SA2097  
High-Speed Swtching Applications  
Unit: mm  
DC-DC Converter Applications  
High DC current gain: h  
= 200 to 500 (I = 0.5 A)  
FE C  
Low collector-emitter saturation: V  
= 0.27 V (max)  
CE (sat)  
High-speed switching: t = 55 ns (typ.)  
f
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
CBO  
V
CEO  
V
EBO  
50  
50  
V
V
V
Collector-emitter voltage  
Emitter-base voltage  
7  
DC  
I
5  
C
Collector current  
Base current  
A
A
Pulse  
I
10  
CP  
I
0.5  
1
B
Ta = 25°C  
Tc = 25°C  
Collector power  
dissipation  
P
W
C
JEDEC  
JEITA  
20  
Junction temperature  
T
150  
°C  
°C  
j
Storage temperature range  
T
55 to 150  
stg  
TOSHIBA  
2-7J1A  
Weight: 0.36 g (typ.)  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating  
conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report  
and estimated failure rate, etc).  
1
2006-11-09  

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