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2SA1213-Y(T2LD,ZC) PDF预览

2SA1213-Y(T2LD,ZC)

更新时间: 2024-01-08 21:26:15
品牌 Logo 应用领域
东芝 - TOSHIBA 开关晶体管
页数 文件大小 规格书
5页 195K
描述
Small Signal Bipolar Transistor

2SA1213-Y(T2LD,ZC) 技术参数

生命周期:Active包装说明:SMALL OUTLINE, R-PSSO-F3
Reach Compliance Code:unknown风险等级:5.67
外壳连接:COLLECTOR最大集电极电流 (IC):2 A
集电极-发射极最大电压:50 V配置:SINGLE
最小直流电流增益 (hFE):120JESD-30 代码:R-PSSO-F3
元件数量:1端子数量:3
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
极性/信道类型:PNP功耗环境最大值:0.5 W
最大功率耗散 (Abs):1 W表面贴装:YES
端子形式:FLAT端子位置:SINGLE
晶体管应用:SWITCHING晶体管元件材料:SILICON
标称过渡频率 (fT):120 MHzVCEsat-Max:0.5 V
Base Number Matches:1

2SA1213-Y(T2LD,ZC) 数据手册

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2SA1213  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process)  
2SA1213  
Power Amplifier Applications  
Power Switching Applications  
Unit: mm  
Low saturation voltage: V  
= 0.5 V (max) (I = 1 A)  
CE (sat)  
C
High speed switching time: t  
Small flat package  
= 1.0 μs (typ.)  
stg  
P
C
= 1.0 to 2.0 W (mounted on a ceramic substrate)  
Complementary to 2SC2873  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
CBO  
V
CEO  
V
EBO  
50  
50  
5  
V
V
V
A
A
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
I
2  
C
PW-MINI  
JEDEC  
Base current  
I
0.4  
500  
B
P
P
C
C
JEITA  
SC-62  
2-5K1A  
Collector power dissipation  
mW  
TOSHIBA  
1000  
(Note 1)  
Weight: 0.05 g (typ.)  
Junction temperature  
T
150  
°C  
°C  
j
Storage temperature range  
T
stg  
55 to 150  
Note 1: Mounted on a ceramic substrate (250 mm2 × 0.8 t)  
Note 2: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Start of commercial production  
1980-07  
1
2013-11-01  

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