2N6400 Series
Preferred Device
Silicon Controlled Rectifiers
Reverse Blocking Thyristors
Designed primarily for half-wave ac control applications, such as
motor controls, heating controls and power supplies; or wherever
half–wave silicon gate–controlled, solid–state devices are needed.
• Glass Passivated Junctions with Center Gate Geometry for Greater
Parameter Uniformity and Stability
http://onsemi.com
SCRs
16 AMPERES RMS
50 thru 800 VOLTS
• Small, Rugged, Thermowatt Construction for Low Thermal
Resistance, High Heat Dissipation and Durability
• Blocking Voltage to 800 Volts
• Device Marking: Logo, Device Type, e.g., 2N6400, Date Code
G
A
K
*MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
Rating
Symbol
Value
Unit
Peak Repetitive Off–State Voltage (Note 1.)
V
V
RRM
Volts
DRM,
MARKING
DIAGRAM
(T = *40 to 125°C, Sine Wave
J
50 to 60 Hz; Gate Open)
2N6400
50
2N6401
2N6402
2N6403
2N6404
100
200
400
600
800
4
TO–220AB
CASE 221A
STYLE 3
YY WW
640x
2N6405
On-State RMS Current
(180° Conduction Angles; T = 100°C)
I
16
A
A
A
T(RMS)
1
C
2
x
= 0, 1, 2, 3, 4 or 5
Average On-State Current
(180° Conduction Angles; T = 100°C)
I
T(AV)
10
3
YY = Year
C
WW = Work Week
Peak Non-repetitive Surge Current
I
160
TSM
(1/2 Cycle, Sine Wave 60 Hz, T = 90°C)
PIN ASSIGNMENT
Cathode
J
2
2
1
2
3
4
Circuit Fusing (t = 8.3 ms)
Forward Peak Gate Power
I t
145
20
A s
Anode
P
Watts
Watts
A
GM
(Pulse Width ≤ 1.0 µs, T = 100°C)
Gate
C
Anode
Forward Average Gate Power
P
0.5
2.0
G(AV)
(t = 8.3 ms, T = 100°C)
C
Forward Peak Gate Current
I
GM
ORDERING INFORMATION
(Pulse Width ≤ 1.0 µs, T = 100°C)
C
Operating Junction Temperature Range
T
–40 to
+125
°C
Device
Package
TO220AB
TO220AB
TO220AB
Shipping
500/Box
500/Box
500/Box
J
2N6400
2N6401
2N6402
Storage Temperature Range
T
stg
–40 to
+150
°C
*Indicates JEDEC Registered Data.
1. V
and V
for all types can be applied on a continuous basis. Ratings
DRM
RRM
2N6403
2N6404
2N6405
TO220AB
TO220AB
TO220AB
500/Box
500/Box
500/Box
apply for zero or negative gate voltage; however, positive gate voltage shall
not be applied concurrent with negative potential on the anode. Blocking
voltages shall not be tested with a constant current source such that the
voltage ratings of the devices are exceeded.
Preferred devices are recommended choices for future use
and best overall value.
Semiconductor Components Industries, LLC, 2001
1
Publication Order Number:
April, 2001 – Rev. 2
2N6400/D