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28LV011RT4FI-25 PDF预览

28LV011RT4FI-25

更新时间: 2024-11-23 22:10:23
品牌 Logo 应用领域
麦斯威 - MAXWELL 可编程只读存储器电动程控只读存储器电可擦编程只读存储器
页数 文件大小 规格书
19页 305K
描述
3.3V 1 Megabit (128K x 8-Bit) EEPROM

28LV011RT4FI-25 数据手册

 浏览型号28LV011RT4FI-25的Datasheet PDF文件第2页浏览型号28LV011RT4FI-25的Datasheet PDF文件第3页浏览型号28LV011RT4FI-25的Datasheet PDF文件第4页浏览型号28LV011RT4FI-25的Datasheet PDF文件第5页浏览型号28LV011RT4FI-25的Datasheet PDF文件第6页浏览型号28LV011RT4FI-25的Datasheet PDF文件第7页 
28LV011  
3.3V 1 Megabit (128K x 8-Bit)  
EEPROM  
V
Hig h Vo lta g e  
CC  
I/ O0  
I/ O7 RDY/ Busy  
Ge ne ra to r  
V
SS  
RES  
OE  
I/ O Buffe r a nd  
Inp ut La tc h  
CE  
WE  
RES  
Co ntro l Lo g ic Tim ing  
A0  
A6  
Y De c o d e r  
X De c o d e r  
Y Ga ting  
28LV011  
Ad d re ss  
Buffe r a nd  
La tc h  
Me m o ry Arra y  
Da ta La tc h  
A7  
A16  
Logic Diagram  
FEATURES:  
DESCRIPTION:  
• 3.3V low voltage operation 128K x 8 Bit EEPROM  
• RAD-PAK® radiation-hardened against natural space  
radiation  
Maxwell Technologies’ 28LV011 high density, 3.3V, 1 Megabit  
EEPROM microcircuit features a greater than 100 krad (Si)  
total dose tolerance, depending upon space mission. The  
28LV011 is capable of in-system electrical Byte and Page pro-  
grammability. It has a 128-Byte Page Programming function to  
make its erase and write operations faster. It also features  
Data Polling and a Ready/Busy signal to indicate the comple-  
tion of erase and programming operations. In the 28LV011,  
hardware data protection is provided with the RES pin, in addi-  
tion to noise protection on the WE signal and write inhibit on  
power on and off. Meanwhile, software data protection is  
implemented using the JEDEC-optional Standard algorithm.  
The 28LV011 is designed for high reliability in the most  
demanding space applications.  
Total dose hardness:  
- > 100 krad (Si), depending upon space mission  
• Excellent Single Event Effects:  
- SEL > 84 MeV/mg/cm2  
TH  
- SEUTH > 37 Mev/mg/cm2 (read mode)  
- SEU saturated cross section = 3E-6 cm2 (read mode)  
- SEUTH = 11.4 Mev/mg/cm2 (write mode)  
- SEU saturated cross section = 5E-3 cm2 (write mode)  
with hard errors  
• Package:  
- 32 Pin RAD-PAK® flat pack  
- 32 Pin RAD-PAK® DIP  
- JEDEC-approved byte-wide pinout  
Address Access Time:  
- 200, 250 ns Access times available  
High endurance:  
- 10,000 erase/write (in Page Mode), 10-year data  
retention  
• Page write mode:  
Maxwell Technologies' patented RAD-PAK® packaging technol-  
ogy incorporates radiation shielding in the microcircuit pack-  
age. It eliminates the need for box shielding while providing  
the required radiation shielding for a lifetime in orbit or space  
mission. In a GEO orbit, RAD-PAK® provides greater than 100  
krad (Si) radiation dose tolerance. This product is available  
with screening up to Class S.  
- 1 to 128 bytes  
Automatic programming  
- 15 ms automatic page/byte write  
Low power dissipation  
- 20 mW/MHz active current (typ.)  
- 72 µW standby (maximum)  
Note:The recommended form of data protection during power  
on/off is to hold the RES pin to V during power up and power  
SS  
down. This may be accompanied by connecting the RES pin  
to the CPU reset line. Failure to provide adequate protection  
during power on/off may result in lost or modified data.  
05.28.02 Rev 2  
1
All data sheets are subject to change without notice  
(858) 503-3300 - Fax: (858) 503-3301- www.maxwell.com  
©2002 Maxwell Technologies  
All rights reserved.  

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