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1SS362FV,L3F(T PDF预览

1SS362FV,L3F(T

更新时间: 2024-11-18 14:50:31
品牌 Logo 应用领域
东芝 - TOSHIBA 快速恢复二极管测试光电二极管
页数 文件大小 规格书
4页 293K
描述
Rectifier Diode

1SS362FV,L3F(T 技术参数

生命周期:Active包装说明:R-PDSO-F3
Reach Compliance Code:unknown风险等级:1.48
Is Samacsys:N应用:FAST RECOVERY
配置:SERIES CONNECTED, CENTER TAP, 2 ELEMENTS二极管元件材料:SILICON
二极管类型:RECTIFIER DIODE最大正向电压 (VF):1.2 V
JESD-30 代码:R-PDSO-F3最大非重复峰值正向电流:1 A
元件数量:2相数:1
端子数量:3最高工作温度:150 °C
最大输出电流:0.1 A封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
最大功率耗散:0.15 W最大重复峰值反向电压:85 V
最大反向电流:0.5 µA最大反向恢复时间:0.004 µs
反向测试电压:80 V表面贴装:YES
端子形式:FLAT端子位置:DUAL
Base Number Matches:1

1SS362FV,L3F(T 数据手册

 浏览型号1SS362FV,L3F(T的Datasheet PDF文件第2页浏览型号1SS362FV,L3F(T的Datasheet PDF文件第3页浏览型号1SS362FV,L3F(T的Datasheet PDF文件第4页 
1SS362FV  
TOSHIBA Diode Silicon Epitaxial Planar Type  
1SS362FV  
Ultra-High-Speed Switching Applications  
Unit: mm  
z Small package  
z Excellent in forward current and forward voltage  
1.2±0.05  
0.8±0.05  
characteristics:  
V
F (3)  
= 0.97 V (typ.)  
z Fast reverse recovery time: t = 1.6 ns (typ.)  
rr  
z Small total capacitance:  
C = 0.9 pF (typ.)  
T
1
2
Absolute Maximum Ratings (Ta = 25°C)  
3
Characteristic  
Symbol  
Rating  
Unit  
Maximum (peak) reverse voltage  
Reverse voltage  
V
85  
80  
V
V
RM  
V
R
Maximum (peak) forward current  
Average forward current  
Surge current (10 ms)  
I
300 *  
100 *  
1 *  
mA  
mA  
A
FM  
I
O
I
FSM  
P
1.ANODE1  
2.CATHODE2  
3.CATHODE1  
ANODE2  
Power dissipation  
150 **  
150  
mW  
°C  
°C  
Junction temperature  
T
j
VESM  
Storage temperature range  
T
55 to 150  
stg  
JEDEC  
JEITA  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e. operating  
temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
TOSHIBA  
1-1Q1A  
Weight: 1.5 mg (typ.)  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
*: Unit rating. Total rating = unit rating × 0.7  
**: Mounted on an FR4 board (25.4 mm × 25.4 mm × 1.6 mm (t))  
0.5 mm  
0.45 mm  
0.45 mm  
0.4 mm  
Electrical Characteristics (Ta = 25°C)  
Test  
Circuit  
Characteristic  
Symbol  
Test Condition  
= 1 mA  
Min  
Typ.  
Max  
Unit  
V
V
I
I
I
0.63  
0.75  
0.97  
F (1)  
F
F
F
Forward voltage  
V
= 10 mA  
= 100 mA  
= 30 V  
F (2)  
V
1.20  
0.1  
0.5  
F (3)  
I
V
V
V
I
R (1)  
R
Reverse current  
μA  
I
= 80 V  
R (2)  
R
R
Total capacitance  
C
T
= 0 V, f = 1 MHz  
0.9  
1.6  
pF  
ns  
Reverse recovery time  
t
= 10 mA  
(Fig. 1)  
4.0  
rr  
F
Start of commercial production  
2004-09  
1
2014-03-01  

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