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ZXM41N0F PDF预览

ZXM41N0F

更新时间: 2024-11-27 03:00:39
品牌 Logo 应用领域
捷特科 - ZETEX 晶体晶体管光电二极管
页数 文件大小 规格书
2页 80K
描述
SOT23 N-CHANNEL ENHANCEMENT MODE VERTICAL D MOSFET

ZXM41N0F 技术参数

是否Rohs认证: 符合生命周期:Transferred
包装说明:SMALL OUTLINE, R-PDSO-G3Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8541.21.00.95
风险等级:5.38其他特性:LOW THRESHOLD
配置:SINGLE最小漏源击穿电压:100 V
最大漏极电流 (ID):0.17 A最大漏源导通电阻:8 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJESD-30 代码:R-PDSO-G3
JESD-609代码:e3湿度敏感等级:1
元件数量:1端子数量:3
工作模式:ENHANCEMENT MODE封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
峰值回流温度(摄氏度):260极性/信道类型:N-CHANNEL
认证状态:Not Qualified表面贴装:YES
端子面层:MATTE TIN端子形式:GULL WING
端子位置:DUAL处于峰值回流温度下的最长时间:40
晶体管元件材料:SILICONBase Number Matches:1

ZXM41N0F 数据手册

 浏览型号ZXM41N0F的Datasheet PDF文件第2页 
ZXM41N0F  
SOT23 N-CHANNEL ENHANCEMENT MODE VERTICAL D MOSFET  
FEATURES  
BVDSS = 100V  
Low Threshold  
DEVICE MARKING  
410  
ABSOLUTE MAXIMUM RATINGS  
PINOUT TOP VIEW  
SOT23  
PARAMETER  
SYMBOL  
VALUE  
100  
UNIT  
Drain-source voltage  
Drain-gate voltage  
V
V
V
V
DS  
100  
DGR  
Continuous drain current at T  
Pulsed drain current  
=25°C  
I
I
170  
mA  
mA  
V
amb  
D
680  
DM  
Gate-source voltage  
V
P
± ±0  
GS  
tot  
Power dissipation at T  
=25°C  
360  
mW  
°C  
amb  
Operating and storage temperature range  
T :T  
-55 to +150  
j
stg  
ELECTRICAL CHARACTERISTICS (at T  
= 25°C unless otherwise stated)  
amb  
PARAMETER  
SYMBOL MIN.  
TYP.  
MAX.  
UNIT CONDITIONS  
Drain-source breakdown voltage BV  
100  
0.5  
V
I =0.25mA, V =0V  
D GS  
DSS  
Gate-source threshold voltage  
Gate-body leakage  
V
I
1.5  
50  
V
I =1mA, V = V  
DS GS  
D
GS(th)  
nA  
nA  
V
=±20V, V =0V  
DS  
GSS  
DSS  
GS  
Zero gate voltage drain current  
Static drain-source on-state  
I
500  
V
=100V, V =0V  
DS GS  
R
8
V
V
=4.5V, I =150mA  
D
DS(on)  
GS  
GS  
(1)  
resistance  
12  
=3V, I =50mA  
D
(1)(2)  
Forward transconductance  
g
C
C
80  
mS  
pF  
V
=25V, I =100mA  
D
fs  
DS  
(2)  
Input capacitance  
25  
9
iss  
oss  
Common source output  
pF  
V
=25V, V =0V, f=1MHz  
GS  
(2)  
DS  
capacitance  
(2)  
Reverse transfer capacitance  
C
4
pF  
ns  
ns  
ns  
ns  
rss  
(2)(3)  
Turn-on delay time  
t
t
t
t
10  
10  
15  
25  
d(on)  
(2)(3)  
Rise time  
r
V
30V, I =280mA  
DD  
D
(2)(3)  
Turn-off delay time  
d(off)  
f
(2)(3)  
Fall time  
NOTES:  
(1)  
Measured under pulsed conditions. Width=300µs. Duty cycle Յ2% (2) Sample test.  
Switching times measured with 50source impedance and <5ns rise time on a pulse generator  
(3)  
ISSUE 1 - JANUARY 2004  
SEMICONDUCTORS  
1

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