ZSSC3018 Datasheet
1. IC Characteristics
1.1 Absolute Maximum Ratings
Note: The absolute maximum ratings are stress ratings only. The ZSSC3018 might not function or be operable above the recommended
operating conditions. Stresses exceeding the absolute maximum ratings might also damage the device. In addition, extended exposure to
stresses above the recommended operating conditions might affect device reliability. IDT does not recommend designing to the “Absolute
Maximum Ratings.”
Table 1.1 Absolute Maximum Ratings
PARAMETER
SYMBOL
Vss
Min
0
TYP
MAX
0
UNITS
Voltage Reference
V
V
Analog Supply Voltage
VDD
-0.4
-0.5
-100
3.63
VDD+0.5
100
Voltage at all Analog and Digital IO Pins
VA_IO, VD_IO
IIN
V
Input Current into any Pin except RES, TEST1, TEST2, TEST3, TEST4,
TEST5, and SS [a], [b]
mA
Electrostatic Discharge Tolerance – Human Body Model (HBM1) [c]
VHBM1
TSTOR
4000
-50
-
V
Storage Temperature
130
°C
[a] Latch-up current limit for RES, TEST1, TEST2, TEST3, TEST4, TEST5, and SS: ±70mA.
[b] Latch-up resistance; reference for pin is 0V.
[c] HBM1: C = 100pF charged to VHBM1 with resistor R = 1.5k in series based on MIL 883, Method 3015.7. ESD protection
referring to the Human Body Model is tested with devices in ceramic dual in-line packages (CDIP) during product qualification.
1.2 Operating Conditions
Note: The reference for all voltages is Vss.
Table 1.2 Operating Conditions
PARAMETER
SYMBOL
VDD
MIN
TYP
MAX
3.6
UNIT
V
Supply Voltage
VDD Rise Time
1.68
-
tVDD
200
1.8
μs
Bridge Current [a]
IVDDB
mA
16.5
125
50
Operation Temperature Range
TAMB
CL
-40
-
°C
nF
External (parasitic) Capacitance between VDDB and VSS
0.01
[a] Power supply rejection is reduced if a current in the range of 16.5mA > IVDDB > 1.8mA is drawn out of VDDB.
A dynamic power-on-reset circuit is implemented in order to achieve the minimum current consumption in Sleep Mode. The VDD low level,
the subsequent rise time, and the VDD rising slope must meet the requirements in Table 1.3 to guarantee an overall IC reset: lower VDD low
levels allow slower rising of the subsequent on-ramp of VDD. Other combinations might also be possible. For example, the reset trigger can
be influenced by increasing the power-down time and lowering the VDD rising slope requirement. Alternatively, the RES pin can be connected
and used to control safe resetting of the IC. RES is low-active – a VDD-VSS-VDD transition at the RES pin leads to a complete ZSSC3018
reset.
© 2016 Integrated Device Technology, Inc
6
November 14, 2016