Standard Products
UT28F64 Radiation-Hardened 8K x 8 PROM
Data Sheet
August 2001
FEATURES
Memory cell LET threshold: >128 MeV-cm2/mg
q QML Q & V compliant part
q Programmable, read-only, asynchronous, radiation-
-
hardened, 8K x 8 memory
-
Supported by industry standard programmer
-
AC and DC testing at factory
o
q 35ns and 45ns maximum address access time (-55 C to
q Packaging options:
o
-
-
28-pin 100-mil center DIP (0.600 x 1.4)
28-lead 50-mil center flatpack (0.490 x 0.74)
+125 C)
q TTL compatible input and TTL/CMOS compatible output
levels
q VDD: 5.0 volts + 10%
q Three-state data bus
q Standard Microcircuit Drawing 5962-96873
q Low operating and standby current
-
Operating: 100mA maximum @28.6MHz
Derating: 3mA/MHz
Standby: 500mA maximum (post-rad)
·
PRODUCT DESCRIPTION
-
The UT28F64 amorphous silicon anti-fuse PROM is a high
performance, asynchronous, radiation-hardened,
q Radiation-hardened process and design; total dose
irradiation testing to MIL-STD-883, Method 1019
8K x 8 programmable memory device. The UT28F64 PROM
features fully asychronous operation requiring no external clocks
or timing strobes. An advanced radiation-hardened twin-well
CMOS process technology is used to implement the UT28F64.
The combination of radiation- hardness, fast access time, and low
power consumption make the UT28F64 ideal for high speed
systems designed for operation in radiation environments.
-
-
Total dose: 1E6 rad(Si)
LETTH(0.25) ~ 100 MeV-cm2/mg
-
SEL Immune >128 MeV-cm2/mg
- Saturated Cross Section cm2 per bit, 1.0E-11
- 1.2E-8 errors/device-day, Adams 90% geosynchronous
heavy ion
MEMORY
ARRAY
A(12:0)
DECODER
SENSE AMPLIFIER
CE
CONTROL
LOGIC
PE
OE
DQ(7:0)
PROGRAMMING
Figure 1. PROM Block Diagram
1