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TPS71530-DIE PDF预览

TPS71530-DIE

更新时间: 2024-09-16 12:22:35
品牌 Logo 应用领域
德州仪器 - TI 稳压器
页数 文件大小 规格书
4页 72K
描述
LOW-DROPOUT LINEAR REGULATOR

TPS71530-DIE 数据手册

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TPS71530-DIE  
www.ti.com  
SLVSBG7 JUNE 2012  
LOW-DROPOUT LINEAR REGULATOR  
Check for Samples: TPS71530-DIE  
1
FEATURES  
24-V Maximum Input Voltage  
APPLICATIONS  
Low Quiescent Current  
Ultra-Low Power Microcontrollers  
Low-Dropout Regulator  
Cellular/Cordless Handsets  
Portable/Battery-Powered Equipment  
xxx  
Available in 3 V  
Minimum/Maximum Specified Current Limit  
DESCRIPTION  
The TPS71530 low-dropout (LDO) voltage regulator offers the benefits of high input voltage, low-dropout voltage,  
low-power operation, and miniaturized packaging. The TPS71530, which operates over an input range of 3 V to  
24 V, is stable with any capacitor (0.47 µF). The low-dropout voltage and low quiescent current allow  
operations at extremely low power levels. Therefore, the TPS71530 is ideal for powering battery management  
ICs. Specifically, since the TPS71530 is enabled as soon as the applied voltage reaches the minimum input  
voltage, the output is quickly available to power continuously operating battery charging ICs.  
The usual PNP pass transistor has been replaced by a PMOS pass element. Because the PMOS pass element  
behaves as a low-value resistor, the low-dropout voltage, typically 415 mV at 50 mA of load current, is directly  
proportional to the load current. The low quiescent current is stable over the entire range of output load current.  
xxx  
ORDERING INFORMATION(1)  
PACKAGE  
DESIGNATOR  
PRODUCT  
PACKAGE  
ORDERABLE PART NUMBER  
PACKAGE QUANTITY  
TPS71530TDB1  
TPS71530TDB2  
400  
10  
TPS71530  
TD(2)  
Bare die in waffle pack  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality  
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room  
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not  
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2012, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  

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