TPC6902
TOSHIBA Multi-Chip Transistor Silicon NPN / PNP Epitaxial Type
TPC6902
High-Speed Switching Applications
Unit: mm
MOS Gate Drive Applications
NPN and PNP transistors are mounted on a compact and slim package.
High DC current gain
: NPN h = 200 to 500 (I = 0.2 A)
FE C
: PNP h = 200 to 500 (I = -0.2 A)
FE
C
Low collector-emitter saturation voltage
: NPN V
: PNP V
= 0.14 V (max)
= -0.2 V (max)
CE (sat)
CE (sat)
High-speed switching
: NPN t = 45 ns (typ.)
f
: PNP t = 40 ns (typ.)
f
Absolute Maximum Ratings (Ta = 25°C)
Rating
NPN
Characteristics
Collector-base voltage
Symbol
Unit
PNP
- 30
- 30
- 30
- 7
V
60
50
30
7
V
V
V
V
A
A
A
CBO
V
CEX
CEO
EBO
Collector-emitter voltage
Emitter-base voltage
V
V
JEDEC
JEITA
―
―
I
DC
2.0
8.0
0.5
- 1.7
- 8.0
- 0.5
C
Collector current
(Note 1)
I
Pulse
CP
TOSHIBA
2-3T1A
Base current
I
B
Weight: 0.011 g (typ.)
Collector power
dissipation (t=10 s)
(Note 2)
Single-device
operation
P
P
P
1.0
0.7
W
C
C
C
Single-device
operation
Collector power
dissipation (DC)
(Note 2)
W
Single-device
value at dual
operation
0.6
Thermal resistance,
junction to ambient
Single-device
operation
R
R
R
125
178
°C/W
°C/W
th (j-a)
th (j-a)
th (j-a)
(t=10 s)
(Note 2)
Single-device
operation
Thermal resistance,
junction to ambient (DC)
(Note 2)
Single-device
value at dual
operation
208
150
Junction temperature
T
°C
°C
j
Storage temperature range
T
stg
−55 to 150
Note 1: Ensure that the junction temperature does not exceed 150°C.
Note 2: Mounted on an FR4 board (glass epoxy, 1.6 mm thick, Cu area: 645 mm2)
Note 3: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
1
2009-09-10