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TLP833F PDF预览

TLP833F

更新时间: 2024-11-01 03:59:23
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
8页 244K
描述
Copiers, Printers, Fax Machines

TLP833F 数据手册

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TLP833(F)  
TOSHIBA Photointerrupter Infrared LED + Phototransistor  
TLP833(F)  
Lead(Pb)-Free  
Copiers, Printers, Fax Machines  
VCRS, Microwave Ovens, Air  
Conditioners  
Automatic Vending Machines  
Various Position Detection Sensors  
The TLP833(F) is a photointerrupter which  
incorporates a high radiant power GaAs LED and a  
fastresponse Si phototransistor. The package has  
a deep gap.  
Package with deep gap (gap: 12 mm)  
Designed for direct mounting on printed circuit  
boards (positioning pins included).  
Gap: 5mm  
Resolution: Slit width 0.5mm  
High current transfer ratio: I /I = 5% (min)  
C F  
High temperature operation: T  
= 95°C (max)  
opr  
TOSHIBA  
Package material: Polybutylene terephthalate  
Weight: 1g (typ.)  
(UL94V0)  
Detector impermeable to visible light  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Forward current  
Symbol  
Rating  
Unit  
mA  
I
50  
F
25°C < Ta 85°C  
0.33  
Forward current  
derating  
ΔI /°C  
mA/°C  
F
Ta > 85°C  
2  
5
Reverse voltage  
V
V
V
R
Collectoremitter voltage  
Emittercollector voltage  
Collector power dissipation  
V
V
35  
5
CEO  
ECO  
V
P
75  
mW  
C
Collector power dissipation derating  
(Ta > 25°C)  
ΔP /°C  
1  
mW/°C  
C
Collector current  
I
50  
mA  
°C  
°C  
°C  
C
Operating temperature range  
Storage temperature range  
Soldering temperature (5 s)  
T
opr  
30~85  
40~100  
260  
T
stg  
sol  
T
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings and the operating ranges.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2007-10-01  

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