TLC59283
www.ti.com
SBVS199A –JUNE 2012–REVISED JUNE 2012
16-Channel, Constant-Current LED Driver with Pre-Charge FET
Check for Samples: TLC59283
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FEATURES
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16-Channel, Constant-Current Sink Output
with On and Off Control
APPLICATIONS
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Video Displays
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Constant-Current Sink Capability:
35 mA (VCC ≤ 3.6 V), 45 mA (VCC > 3.6 V)
Message Boards
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LED Power-Supply Voltage: Up to 10 V
VCC = 3 V to 5.5 V
DESCRIPTION
The TLC59283 is a 16-channel, constant-current sink
light-emitting diode (LED) driver. Each channel can
be individually controlled with
communications protocol that is compatible with 3.3-V
or 5-V CMOS logic levels, depending on the
operating VCC. When the serial data buffer is loaded,
a LAT rising edge transfers the data to the OUTn
outputs. The BLANK pin can be used to turn off all
OUTn outputs during power-on and output data
latching to prevent unwanted image displays during
these times. The constant-current value of all 16
channels is set by a single external resistor.
Constant-Current Accuracy:
a simple serial
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Channel-to-Channel:
±1.4% (typ), ±3% (max)
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Device-to-Device: ±2% (typ), ±4% (max)
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CMOS Logic Level I/O
Data Transfer Rate: 35 MHz
BLANK Pulse Width: 50 ns
Pre-Charge FET for Ghosting Reduction
Grouped Switching Delay for Noise Reduction
Operating Temperature: –40°C to +85°C
Each constant-current output has a pre-charge field-
effect transistor (FET) that can reduce ghosting on
the multiplexing (dynamic) drive LED display. Multiple
TLC59283s can be cascaded together to control
additional LEDs from the same processor.
VLED
+
SW
COMn
COMn
COM1
COM0
VLED
SW
COM1
VLED
SW
COM0
¼
¼
¼
OUT0
SIN
OUT15
SOUT
OUT0
SIN
OUT15
SOUT
DATA
SCLK
SCLK
LAT
SCLK
LAT
LAT
Controller
BLANK
VCC
VCC
BLANK
BLANK
VCC
GND
VCC
GND
IREF
IREF
Device 1
Device n
RIREF
RIREF
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Typical Application Circuit (Multiple Daisy-Chained TLC59283s)
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2012, Texas Instruments Incorporated