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THS1206MDAREP

更新时间： 2024-09-10 11:58:15
品牌 Logo 应用领域
德州仪器 - TI 转换器
页数 文件大小 规格书
43页 782K
描述
12-BIT 6 MSPS, SIMULTANEOUS SAMPLING ANALOG-TO-DIGITAL CONVERTERS

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中文翻译

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THS1206MDAREP 数据手册

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SGLS126A − JULY 2002 − REVISED FEBRUARY 2003  
D
Internal Voltage References . . . 50 PPM/°C  
features  
and 5% Accuracy  
D
Controlled Baseline  
− One Assembly/Test Site, One Fabrication  
Site  
D
D
D
D
Glueless DSP Interface  
Parallel µC/DSP Interface  
Integrated FIFO  
D
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Extended Temperature Performance of  
−55°C to 125°C  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
Available in TSSOP Package  
applications  
D
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Enhanced Product Change Notification  
D
Radar Applications  
†
Qualification Pedigree  
D
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Communications  
High-Speed 6 MSPS ADC  
Control Applications  
4 Single-Ended or 2 Differential Inputs  
High-Speed DSP Front-End  
Selected Military Applications  
Simultaneous Sampling of 4 Single-Ended  
Signals or 2 Differential Signals or  
Combination of Both  
DA PACKAGE  
(TOP VIEW)  
D
D
D
Differential Nonlinearity Error: 1 LSB  
Integral Nonlinearity Error: 1.8 LSB  
Signal-to-Noise and Distortion Ratio: 68 dB  
D0  
D1  
D2  
D3  
D4  
D5  
AINP  
1
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
22  
AINM  
2
at f = 2 MHz  
I
BINP  
3
D
D
D
D
Auto-Scan Mode for 2, 3, or 4 Inputs  
3-V or 5-V Digital Interface Compatible  
Low Power: 216 mW Max  
BINM  
4
REFIN  
REFOUT  
REFP  
REFM  
AGND  
5
6
5-V Analog Single Supply Operation  
BV  
7
DD  
†
BGND  
D6  
Component qualification in accordance with JEDEC and industry  
standards to ensure reliable operation over an extended  
temperature range. This includes, but is not limited to, Highly  
Accelerated Stress Test (HAST) or biased 85/85, temperature  
cycle, autoclave or unbiased HAST, electromigration, bond  
intermetallic life, and mold compound life. Such qualification  
testing should not be viewed as justifying use of this component  
beyond specified performance and environmental limits.  
8
9
D7  
AV  
10  
11  
12  
13  
14  
15  
16  
DD  
D8  
CS0  
D9  
21 CS1  
D10/RA0  
D11/RA1  
20 WR (R/W)  
19 RD  
18  
17  
CONV_CLK (CONVST)  
DATA_AV  
DV  
DD  
DGND  
description  
The THS1206 is a CMOS, low-power, 12-bit,  
6 MSPS analog-to-digital converter (ADC). The  
speed, resolution, bandwidth, and single-supply  
operation are suited for applications in radar,  
imaging, high-speed acquisition, and communications. A multistage pipelined architecture with output error  
correction logic provides for no missing codes over the full operating temperature range. Internal control  
registers are used to program the ADC into the desired mode. The THS1206 consists of four analog inputs,  
which are sampled simultaneously. These inputs can be selected individually and configured to single-ended  
or differential inputs. An integrated 16 word deep FIFO allows the storage of data in order to take the load off  
of the processor connected to the ADC. Internal reference voltages for the ADC (1.5 V and 3.5 V) are provided.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
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Copyright 2002 − 2003, Texas Instruments Incorporated  
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1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...43

中文翻译

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THS1206MDAREP 替代型号

型号 品牌 替代类型 描述 数据表
THS1206CDAR TI

类似代替

 暂无描述
THS1206CDA TI

类似代替

 12-BIT 6 MSPS, SIMULTANEOUS SAMPLING ANALOG-TO-DIGITAL CONVERTERS
THS1206IDA TI

类似代替

 12-BIT 6 MSPS, SIMULTANEOUS SAMPLING ANALOG-TO-DIGITAL CONVERTERS

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