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TC7WH240FK_09 PDF预览

TC7WH240FK_09

更新时间: 2024-11-16 12:22:59
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
7页 186K
描述
Dual Bus Buffer Inverted, 3-State Outputs

TC7WH240FK_09 数据手册

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TC7WH240FU/FK  
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic  
TC7WH240FU,TC7WH240FK  
Dual Bus Buffer Inverted, 3-State Outputs  
Features  
TC7WH240FU  
High speed: t = 3.6ns (typ.) at V  
= 5V, C = 15pF  
pd  
CC L  
Low power dissipation: I  
= 2 μA (max) at Ta = 25°C  
CC  
High noise immunity: V  
5.5V Tolerant inputs.  
= V  
= 28% V  
(min)  
NIH  
NIL  
CC  
Balanced propagation delays: t  
t  
pHL  
pLH  
Wide operating voltage range: V  
= 2 to 5.5 V  
CC  
Low Noise : V  
= 0.8 V (max)  
(SM8)  
OLP  
TC7WH240FK  
Marking  
SM8  
US8  
Product Name  
Lot No.  
H 2 4 0  
W H  
240  
(US8)  
Weight  
SSOP8-P-0.65: 0.02 g (typ.)  
SSOP8-P-0.50A: 0.01 g (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Pin Assignment (top view)  
Characteristics  
Supply voltage  
Symbol  
Rating  
Unit  
G2  
7
Y1  
6
A2  
V
CC  
8
V
0.5 to 7.0  
0.5 to 7.0  
V
CC  
5
DC input voltage  
V
V
IN  
DC output voltage  
Input diode current  
Output diode current  
DC output current  
V
0.5 to V  
+ 0.5  
V
OUT  
CC  
I
20  
mA  
mA  
mA  
mA  
IK  
I
±20 (Note 1)  
±25  
OK  
I
OUT  
DC V /ground current  
CC  
I
±50  
CC  
300 (SM8)  
200 (US8)  
65 to 150  
260  
Power dissipation  
P
mW  
1
3
4
2
D
G1  
Y2  
GND  
A1  
Storage temperature  
T
stg  
°C  
°C  
Lead temperature (10 s)  
T
L
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings and the operating ranges.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: VOUT < GND, VOUT > VCC  
1
2009-09-28  

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