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TC7WH126FK(TE85L,F) PDF预览

TC7WH126FK(TE85L,F)

更新时间: 2024-11-16 19:54:07
品牌 Logo 应用领域
东芝 - TOSHIBA 驱动光电二极管逻辑集成电路
页数 文件大小 规格书
7页 177K
描述
IC,BUFFER/DRIVER,SINGLE,2-BIT,CMOS,TSSOP,8PIN,PLASTIC

TC7WH126FK(TE85L,F) 技术参数

是否Rohs认证: 符合生命周期:Obsolete
包装说明:TSSOP, TSSOP8,.12,20Reach Compliance Code:unknown
HTS代码:8542.39.00.01风险等级:5.63
控制类型:ENABLE HIGHJESD-30 代码:R-PDSO-G8
负载电容(CL):50 pF逻辑集成电路类型:BUS DRIVER
最大I(ol):0.004 A位数:2
功能数量:1端子数量:8
最高工作温度:85 °C最低工作温度:-40 °C
输出特性:3-STATE输出极性:TRUE
封装主体材料:PLASTIC/EPOXY封装代码:TSSOP
封装等效代码:TSSOP8,.12,20封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, THIN PROFILE, SHRINK PITCH包装方法:TAPE AND REEL
电源:2/5.5 VProp。Delay @ Nom-Sup:13 ns
认证状态:Not Qualified子类别:Bus Driver/Transceivers
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子形式:GULL WING
端子节距:0.5 mm端子位置:DUAL
Base Number Matches:1

TC7WH126FK(TE85L,F) 数据手册

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TC7WH126FU/FK  
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic  
TC7WH126FU, TC7WH126FK  
Bus Buffer with 3-STATE Output  
TC7WH126FU  
Features  
High speed: t = 3.8 ns (typ.) at V  
= 5.0 V, C = 15 pF  
pd  
CC L  
Low power dissipation: I  
= 2 μA (max) at Ta = 25°C  
CC  
High noise immunity: V  
5.5 V tolerant inputs  
= V  
= 28% V  
(min)  
NIH  
NIL  
CC  
(SM8)  
Balanced propagation delays : t  
t  
pHL  
pLH  
Wide operating voltage range: V  
= 2.0 to 5.5 V  
CC  
TC7WH126FK  
Low Noise : V  
= 0.8V (max.)  
OLP  
Marking  
(US8)  
SM8  
US8  
Product name  
Lot. No  
Weight  
SSOP8-P-0.65 : 0.02 g (typ.)  
SSOP8-P-0.50A : 0.01 g (typ.)  
H 126  
WH  
126  
Absolute Maximum Ratings (Ta = 25°C)  
Pin Assignment (top view)  
Characteristics  
Supply voltage  
Symbol  
Rating  
Unit  
V
0.5 to 7.0  
0.5 to 7.0  
V
CC  
1
2
3
4
8
7
6
5
V
CC  
DC input voltage  
V
V
G1  
A1  
IN  
DC output voltage  
Input diode current  
Output diode current  
DC output current  
V
0.5 to V  
+ 0.5  
V
OUT  
CC  
G2  
Y1  
A2  
I
20  
mA  
mA  
mA  
mA  
IK  
Y2  
I
±20 (Note1)  
±25  
OK  
GND  
I
OUT  
DC V /ground current  
CC  
I
±50  
CC  
300(SM8)  
Power dissipation  
P
mW  
D
200(US8)  
65 to 150  
260  
Storage temperature  
T
stg  
°C  
°C  
Lead temperature (10 s)  
T
L
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if  
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings and the operating ranges.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/”Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1:VOUT<GND,VOUT>VCC  
1
2009-09-21  

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