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TC237H PDF预览

TC237H

更新时间: 2024-09-18 21:17:43
品牌 Logo 应用领域
德州仪器 - TI /
页数 文件大小 规格书
15页 213K
描述
SPECIALTY ANALOG CIRCUIT, CDIP12, 1.78 MM PITCH, WINDOWED, CERAMIC, DIP-12

TC237H 技术参数

是否无铅: 含铅生命周期:Obsolete
零件包装代码:WDIP包装说明:WSDIP,
针数:12Reach Compliance Code:unknown
HTS代码:8542.39.00.01风险等级:5.83
其他特性:ALSO REQUIRES 16V, 26V AND 15V SUPPLIES模拟集成电路 - 其他类型:ANALOG CIRCUIT
JESD-30 代码:R-CDIP-T12长度:12.2 mm
功能数量:1端子数量:12
最高工作温度:45 °C最低工作温度:-10 °C
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装代码:WSDIP
封装形状:RECTANGULAR封装形式:IN-LINE, WINDOW, SHRINK PITCH
认证状态:Not Qualified座面最大高度:5.78 mm
最大供电电压 (Vsup):23 V最小供电电压 (Vsup):21 V
标称供电电压 (Vsup):22 V表面贴装:NO
技术:MOS温度等级:COMMERCIAL
端子形式:THROUGH-HOLE端子节距:1.778 mm
端子位置:DUAL宽度:11.43 mm
Base Number Matches:1

TC237H 数据手册

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TC237B  
680- × 500-PIXEL CCD IMAGE SENSOR  
SOCS063 – APRIL 2001  
DUAL-IN-LINE PACKAGE  
(TOP VIEW)  
D
High Resolution, 1/3-in Solid-State Image  
Sensor for NTSC Black and White  
Applications  
ODB 1  
IAG2 2  
SUB 3  
12 IAG1  
11 SAG  
10 SAG  
9 SUB  
8 SRG  
7 RST  
D
D
D
340,000 Pixels per Field  
Frame Memory  
658 (H) × 496 (V) Active Elements in Image  
Sensing Area Compatible With Electronic  
Centering  
ADB 4  
D
Multimode Readout Capability  
– Progressive Scan  
– Interlaced Scan  
OUT1 5  
OUT2 6  
– Dual-Line Readout  
– Image Area Line Summing  
– Smear Subtraction  
D
D
D
D
D
High Photoresponse Uniformity  
High Dynamic Range  
High Sensitivity  
D
D
Fast Single-Pulse Clear Capability  
Continuous Electronic Exposure Control  
From 1/601/50,000 s  
High Blue Response  
D
7.4-µm Square Pixels  
Solid-State Reliability With No Image  
Burn-In, Residual Imaging, Image  
Distortion, Image Lag, or  
Microphonics  
D
Advanced Lateral Overflow Drain  
Antiblooming  
D
Low Dark Current  
description  
The TC237B is a frame-transfer, charge-coupled device (CCD) image sensor designed for use in single-chip  
black and white National Television Standards Committee (NTSC) TV, computer, and special-purpose  
applications that require low cost and small size.  
The image-sensing area of the TC237B device is configured into 500 lines with 680 elements in each line.  
Twenty-two elements are provided in each line for dark reference. The antiblooming feature of the sensor is  
based on an advanced lateral overflow drain concept. The sensor can be operated in a true interlace mode as  
a 658(H) × 496(V) sensor with a low dark current. An important feature of the TC237B high-resolution sensor  
is the ability to capture a full 340,000 pixels per field. The image sensor also provides high-speed image transfer  
capability and a continuous electronic exposure control without the loss of sensitivity and resolution inherent  
in other technologies. Charge voltage is converted to signal voltage at 13 µV per electron by a high-performance  
structure with a reset and a voltage-reference generator. The signal is further buffered by a low-noise,  
two-stage, source-follower amplifier to provide high-output drive capability.  
The TC237B sensor is built using TI-proprietary advanced virtual-phase (AVP) technology, which provides  
devices with high blue response, low dark current, high photoresponse uniformity, and single-phase clocking.  
The TC237B sensor is characterized for operation from 10°C to 45°C.  
This MOS device contains limited built-in gate protection. During storage or handling, the device leads should be shorted together  
or the device should be placed in conductive foam. In a circuit, unused inputs should always be connected to V . Under no  
SS  
circumstances should pin voltages exceed absolute maximum ratings. Avoid shorting OUT to V  
during operation to prevent  
SS  
damage to the amplifier. The device can also be damaged if the output terminals are reverse-biased and an excessive current is  
allowed to flow. Specific guidelines for handling devices of this type are contained in the publication Guidelines for Handling  
Electrostatic-Discharge-Sensitive (ESDS) Devices and Assemblies available from Texas Instruments.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
TI is a trademark of Texas Instruments.  
All other trademarks are the property of their respective owners.  
Copyright 2001, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  

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