DAP-32
11mm ´ 8.1mm
DCA-48
12.5mm ´ 8.1mm
TAS5760L
www.ti.com
SLOS782 –JULY 2013
General Purpose I2S Input Class D Amplifier
Check for Samples: TAS5760L
1
FEATURES
2
•
Audio I/O Configuration:
– SNR = 100 dB A-Wtd (Ref. to THD+N = 1%)
–
–
Single Stereo I²S Input
APPLICATIONS
Stereo Bridge Tied Load (BTL) or Mono
Parallel Bridge Tied Load (PBTL) Operation
•
•
•
LCD/LED TV and Multi-Purpose Monitors
Sound Bars, Docking Stations, PC Audio
General Purpose Audio Equipment
–
32, 44.1, 48, 88.2, 96 kHz Sample Rates
•
General Operational Features:
–
–
–
Selectable Hardware or Software Control
Integrated Digital Output Clipper
Power at 10% THD+N vs PVDD
40
Programmable I²C Address (1101100[R/W] or
THD+N = 10%
RL = 4 Ω
35
30
25
20
15
10
5
1101101[R/W])
RL = 6 Ω
RL = 8 Ω
4 Ω Thermal Limit
6 Ω Thermal Limit
8 Ω Thermal Limit
–
–
Closed Loop Amplifier Architecture
Adjustable Switching Frequency for
Speaker Amplifier
•
•
Robustness Features:
–
Clock Error, DC and Short Circuit
Protection
–
Over Temperature and Programmable
Overcurrent Protection
0
4
6
8
10
12
14
16
Audio Performance (PVDD = 12V, RSPK = 8Ω,
Supply Voltage (V)
G001
SPK_GAIN[1:0] Pins = 01)
NOTE: Thermal Limits were determined via the
TAS5760xxEVM
–
–
Idle Channel Noise = 65 µVrms (A-Wtd)
THD+N = 0.09 % (at 1 W, 1 kHz)
DVDD
ANA_REG
AVDD
PVDD
GVDD_REG
Internal
Voltage
Supplies
Internal Reference
Regulators
Internal Gate
Drive Regulator
Closed Loop Class D Amplifier
SFT_CLIP
Full Bridge
Power Stage
A
Digital to
PWM
Conversion
SPK_OUTA+
SPK_OUTA-
SPK_OUTB+
SPK_OUTB-
Digital
Boost
&
Volume
Control
Gate
Drives
MCLK
SCLK
LRCK
SDIN
Serial
Audio
Port
Over-
Current
Protection
Digital
Clipper
Soft
Clipper
Gate
Full Bridge
Power Stage
B
Analog
Gain
Drives
Clock Monitoring
Die
Temp. Monitor
Internal Control Registers and State Machines
SPK_GAIN0 SPK_GAIN1
SPK_SLEEP/ FREQ/
SPK_SD SPK_FAULT
PBTL/
SCL
ADR
SDA
1
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2
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated