512 Kbit / 1 Mbit / 2 Mbit (x8) Many-Time Programmable Flash
SST27SF512 / SST27SF010 / SST27SF020
SST27SF512 / 010 / 0205.0V-Read 512Kb / 1Mb / 2Mb (x8) MTP flash memories
Data Sheet
FEATURES:
•
•
•
Organized as 64K x8 / 128K x8 / 256K x8
4.5-5.5V Read Operation
•
Fast Byte-Program Operation
– Byte-Program Time: 20 µs (typical)
– Chip Program Time:
Superior Reliability
1.4 seconds (typical) for SST27SF512
2.8 seconds (typical) for SST27SF010
5.6 seconds (typical) for SST27SF020
– Endurance: At least 1000 Cycles
– Greater than 100 years Data Retention
•
•
Low Power Consumption
•
Electrical Erase Using Programmer
– Active Current: 20 mA (typical)
– Standby Current: 10 µA (typical)
– Does not require UV source
– Chip-Erase Time: 100 ms (typical)
Fast Read Access Time
•
•
•
TTL I/O Compatibility
– 70 ns
JEDEC Standard Byte-wide EPROM Pinouts
Packages Available
– 32-lead PLCC
– 32-lead TSOP (8mm x 14mm)
– 28-pin PDIP for SST27SF512
– 32-pin PDIP for SST27SF010/020
•
All non-Pb (lead-free) devices are RoHS compliant
PRODUCT DESCRIPTION
The SST27SF512/010/020 are a 64K x8 / 128K x8 / 256K
x8 CMOS, Many-Time Programmable (MTP) low cost
flash, manufactured with SST’s proprietary, high perfor-
mance SuperFlash technology. The split-gate cell design
and thick oxide tunneling injector attain better reliability and
manufacturability compared with alternate approaches.
These MTP devices can be electrically erased and pro-
grammed at least 1000 times using an external program-
mer with a 12V power supply. They have to be erased prior
to programming. These devices conform to JEDEC stan-
dard pinouts for byte-wide memories.
Device Operation
The SST27SF512/010/020 are a low cost flash solution
that can be used to replace existing UV-EPROM, OTP,
and mask ROM sockets. These devices are functionally
(read and program) and pin compatible with industry
standard EPROM products. In addition to EPROM func-
tionality, these devices also support electrical Erase
operation via an external programmer. They do not
require a UV source to erase, and therefore the pack-
ages do not have a window.
Featuring
high-performance
Byte-Program,
the
Read
SST27SF512/010/020 provide a Byte-Program time of 20
µs. Designed, manufactured, and tested for a wide spec-
trum of applications, these devices are offered with an
endurance of at least 1000 cycles. Data retention is rated at
greater than 100 years.
The Read operation of the SST27SF512/010/020 is con-
trolled by CE# and OE#. Both CE# and OE# have to be low
for the system to obtain data from the outputs. Once the
address is stable, the address access time is equal to the
delay from CE# to output (TCE). Data is available at the out-
put after a delay of TOE from the falling edge of OE#,
assuming that CE# pin has been low and the addresses
have been stable for at least TCE-TOE. When the CE# pin is
high, the chip is deselected and a typical standby current of
10 µA is consumed. OE# is the output control and is used
to gate data from the output pins. The data bus is in high
impedance state when either CE# or OE# is high.
The SST27SF512/010/020 are suited for applications that
require infrequent writes and low power nonvolatile stor-
age. These devices will improve flexibility, efficiency, and
performance while matching the low cost in nonvolatile
applications that currently use UV-EPROMs, OTPs, and
mask ROMs.
To meet surface mount and conventional through hole
requirements, the SST27SF512 are offered in 32-lead
PLCC, 32-lead TSOP, and 28-pin PDIP packages. The
SST27SF010/020 are offered in 32-pin PDIP, 32-lead
PLCC, and 32-lead TSOP packages. See Figures 1, 2, and
3 for pin assignments.
©2005 Silicon Storage Technology, Inc.
The SST logo and SuperFlash are registered trademarks of Silicon Storage Technology, Inc.
MTP is a trademark of Silicon Storage Technology, Inc.
S71152-11-000
1
9/05
These specifications are subject to change without notice.