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SSM3J144TU PDF预览

SSM3J144TU

更新时间: 2023-12-20 18:45:58
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
9页 269K
描述
P-ch MOSFET, -20 V, -3.2 A, 0.093 Ω@4.5V, SOT-323F(UFM)

SSM3J144TU 数据手册

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SSM3J144TU  
6. Electrical Characteristics  
6.1. Static Characteristics (Ta = 25unless otherwise specified)  
Characteristics  
Gate leakage current  
Symbol  
Test Condition  
Min  
Typ.  
Max  
Unit  
IGSS  
IDSS  
VGS = -8/+6 V, VDS = 0 V  
VDS = -20 V, VGS = 0 V  
±1  
-1  
µA  
Drain cut-off current  
Drain-source breakdown voltage  
Drain-source breakdown voltage  
Gate threshold voltage  
V(BR)DSS ID = -1 mA, VGS = 0 V  
-20  
-15  
-0.3  
V
(Note 1) V(BR)DSX ID = -1 mA, VGS = 5 V  
(Note 2)  
Vth  
VDS = -3 V, ID = -1 mA  
-1.0  
93  
Drain-source on-resistance  
(Note 3) RDS(ON) ID = -1.5 A, VGS = -4.5 V  
ID = -1.0 A, VGS = -2.5 V  
78.5  
97.5  
120  
141  
5.8  
mΩ  
123  
168  
240  
ID = -0.5 A, VGS = -1.8 V  
ID = -0.25 A, VGS = -1.5 V  
Forward transfer admittance  
(Note 3)  
|Yfs|  
VDS = -3 V, ID = -1.0 A  
2.9  
S
Note 1: If a reverse bias is applied between gate and source, this device enters V(BR)DSX mode. Note that the drain-  
source breakdown voltage is lowered in this mode.  
Note 2: Let Vth be the voltage applied between gate and source that causes the drain current (ID) to below (-1 mA for  
this device). Then, for normal switching operation, VGS(ON) must be higher than Vth, and VGS(OFF) must be  
lower than Vth. This relationship can be expressed as: VGS(OFF) < Vth < VGS(ON).  
Take this into consideration when using the device.  
Note 3: Pulse measurement.  
6.2. Dynamic Characteristics (Ta = 25unless otherwise specified)  
Characteristics  
Input capacitance  
Symbol  
Test Condition  
Min  
Typ.  
Max  
Unit  
pF  
Ciss  
Crss  
Coss  
ton  
VDS = -10 V, VGS = 0 V,  
f = 1 MHz  
290  
32  
Reverse transfer capacitance  
Output capacitance  
44  
Switching time (turn-on time)  
VDD = -10 V, ID = -0.5 A  
VGS = 0 to -2.5 V, RG = 4.7 Ω  
Duty 1%, Input: tr, tf < 5 ns  
Common source  
12  
ns  
Switching time (turn-off time)  
toff  
46.2  
6.3. Switching Time Test Circuit  
Fig. 6.3.1 Test Circuit of Switching Time  
Fig. 6.3.2 Input Waveform/Output Waveform  
©2017-2021  
Toshiba Electronic Devices & Storage Corporation  
2021-06-25  
Rev.2.0  
3

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