SN75512C

更新时间： 2024-09-20 04:31:15

品牌	Logo	应用领域
德州仪器 - TI		显示器驱动
页数	文件大小	规格书
7页	85K
描述
VACUUM FLUORESCENT DISPLAY DRIVERS

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数据手册

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SN75512C 数据手册

SN65512C, SN75512C

VACUUM FLUORESCENT DISPLAY DRIVERS

SLDS054 – D3516, MAY 1990

DW OR N PACKAGE

(TOP VIEW)

• Each Device Drives 12 Lines

• 60-V Output Voltage Swing Capability

• 25-mA Output Source Current Capability

• High-Speed Serially-Shifted Data Input

• TTL-Compatible Inputs

Q11

Q12

Q10

STROBE

SERIAL OUT

DATA IN

• Latches on All Driver Outputs

CC2

15 GND

description

CC1

CLOCK

The SN65512C and SN75512C are monolithic

LATCH ENABLE

†

BIDFET integrated circuits designed to drive a

dot matrix or segmented vacuum fluorescent

display.

All device inputs are diode-clamped pnp inputs

and assume a high logic level when open

circuited. The nominal input threshold is 1.5 V.

Outputs are totem-pole structures formed by an

npn emitter follower and double-diffused MOS

(DMOS) transistors.

‡

logic symbol

TTL/VAC

FLUOR DISPLAY

LATCH ENABLE

STROBE

The device consists of a 12-bit shift register,

12 latches, and 12 output AND gates. Serial data

is entered into the shift register on the low-to-high

transitionofCLOCK. Whenhigh, LATCHENABLE

transfers the shift register contents to the outputs

of the 12 latches. The active-low STROBE input

enables all Q outputs. Serial data output from the

shift register can be used to cascade shift

registers. This output is not affected by LATCH

ENABLE or STROBE.

SRG12

C1/

CLOCK

DATA IN

The SN65512C is characterized for operation

from –40°C to 85°C. The SN75512C is

characterized for operation from 0°C to 70°C.

Q10

Q11

Q12

SERIAL OUT

‡

This symbol is in accordance with ANSI/IEEE Std 91-1984

and IEC Publication 617-12.

†BIDFET – Bipolar, double-diffused, N-channel and P-channel MOS transistors on same chip. This is a patented process.

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

4–1

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

12 3 4 5 6 7

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