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SN74LVC112ADE4 PDF预览

SN74LVC112ADE4

更新时间: 2024-11-20 22:39:03
品牌 Logo 应用领域
德州仪器 - TI 触发器锁存器逻辑集成电路光电二极管
页数 文件大小 规格书
13页 289K
描述
DUAL NEGATIVE-EDGE-TRIGGERED J-K FLIP-FLOP WITH CLEAR AND PRESET

SN74LVC112ADE4 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Obsolete零件包装代码:SOIC
包装说明:GREEN, PLASTIC, MS-012AC, SOIC-16针数:16
Reach Compliance Code:unknownHTS代码:8542.39.00.01
风险等级:5.32Is Samacsys:N
系列:LVC/LCX/ZJESD-30 代码:R-PDSO-G16
JESD-609代码:e4长度:9.9 mm
负载电容(CL):50 pF逻辑集成电路类型:J-K FLIP-FLOP
最大频率@ Nom-Sup:150000000 Hz最大I(ol):0.024 A
湿度敏感等级:1位数:2
功能数量:2端子数量:16
最高工作温度:85 °C最低工作温度:-40 °C
输出极性:COMPLEMENTARY封装主体材料:PLASTIC/EPOXY
封装代码:SOP封装等效代码:SOP16,.25
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
包装方法:TUBE峰值回流温度(摄氏度):260
电源:3.3 VProp。Delay @ Nom-Sup:5.9 ns
传播延迟(tpd):7.1 ns认证状态:Not Qualified
座面最大高度:1.75 mm子类别:FF/Latches
最大供电电压 (Vsup):3.6 V最小供电电压 (Vsup):1.65 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Nickel/Palladium/Gold (Ni/Pd/Au)端子形式:GULL WING
端子节距:1.27 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED触发器类型:NEGATIVE EDGE
宽度:3.9 mm最小 fmax:150 MHz
Base Number Matches:1

SN74LVC112ADE4 数据手册

 浏览型号SN74LVC112ADE4的Datasheet PDF文件第2页浏览型号SN74LVC112ADE4的Datasheet PDF文件第3页浏览型号SN74LVC112ADE4的Datasheet PDF文件第4页浏览型号SN74LVC112ADE4的Datasheet PDF文件第5页浏览型号SN74LVC112ADE4的Datasheet PDF文件第6页浏览型号SN74LVC112ADE4的Datasheet PDF文件第7页 
SN74LVC112A  
DUAL NEGATIVE-EDGE-TRIGGERED J-K FLIP-FLOP  
WITH CLEAR AND PRESET  
www.ti.com  
SCAS289LJANUARY 1993REVISED AUGUST 2005  
FEATURES  
D, DB, DGV, NS, OR PW PACKAGE  
(TOP VIEW)  
Operates From 1.65 V to 3.6 V  
Inputs Accept Voltages to 5.5 V  
Max tpd of 4.8 ns at 3.3 V  
1CLK  
1K  
V
CC  
1
2
3
4
5
6
7
8
16  
15  
14  
13  
1CLR  
2CLR  
2CLK  
Typical VOLP (Output Ground Bounce)  
1J  
<0.8 V at VCC = 3.3 V, TA = 25°C  
1PRE  
1Q  
Typical VOHV (Output VOH Undershoot)  
>2 V at VCC = 3.3 V, TA = 25°C  
12 2K  
11  
10  
9
1Q  
2J  
Latch-Up Performance Exceeds 250 mA Per  
JESD 17  
2Q  
2PRE  
2Q  
GND  
ESD Protection Exceeds JESD 22  
– 2000-V Human-Body Model (A114-A)  
– 200-V Machine Model (A115-A)  
– 1000-V Charged-Device Model (C101)  
DESCRIPTION/ORDERING INFORMATION  
This dual negative-edge-triggered J-K flip-flop is designed for 1.65-V to 3.6-V VCC operation.  
A low level at the preset (PRE) or clear (CLR) inputs sets or resets the outputs, regardless of the levels of the  
other inputs. When PRE and CLR are inactive (high), data at the J and K inputs meeting the setup-time  
requirements is transferred to the outputs on the negative-going edge of the clock pulse. Clock triggering occurs  
at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval,  
data at the J and K inputs can be changed without affecting the levels at the outputs. The SN74LVC112A can  
perform as a toggle flip-flop by tying J and K high.  
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of these devices as translators  
in a mixed 3.3-V/5-V system environment.  
ORDERING INFORMATION  
TA  
PACKAGE(1)  
ORDERABLE PART NUMBER  
TOP-SIDE MARKING  
Tube of 40  
SN74LVC112AD  
SOIC – D  
Reel of 2500 SN74LVC112ADR  
Reel of 250 SN74LVC112ADT  
LVC112A  
SOP – NS  
Reel of 2000 SN74LVC112ANSR  
Reel of 2000 SN74LVC112ADBR  
LVC112A  
LC112A  
–40°C to 85°C  
SSOP – DB  
Tube of 90  
Reel of 2000 SN74LVC112APWR  
Reel of 250 SN74LVC112APWT  
Reel of 2000 SN74LVC112ADGVR  
SN74LVC112APW  
TSSOP – PW  
TVSOP – DGV  
LC112A  
LC112A  
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at  
www.ti.com/sc/package.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 1993–2005, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  

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