SN74CBT16233
16-BIT 1-OF-2 FET MULTIPLEXER/DEMULTIPLEXER
SCDS010H – MAY 1995 – REVISED OCTOBER 1998
DGG, DGV, OR DL PACKAGE
5-Ω Switch Connection Between Two Ports
(TOP VIEW)
TTL-Compatible Input Levels
Package Options Include Plastic Thin
Shrink Small-Outline (DGG), Thin Very
Small-Outline (DGV), and 300-mil Shrink
Small-Outline (DL) Packages
1A
2B1
2B2
3A
1B1
1B2
2A
3B1
3B2
4A
1
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
2
3
4
4B1
4B2
5A
5
description
6
5B1
5B2
6A
7
The SN74CBT16233 is a 16-bit 1-of-2 FET
multiplexer/demultiplexer used in applications in
which two separate data paths must be
multiplexed onto, or demultiplexed from, a single
path. This device can be used for memory
interleaving, where two different banks of memory
need to be addressed simultaneously. The device
can be used as two 8-bit to 16-bit multiplexers or
as one 16-bit to 32-bit multiplexer.
6B1
6B2
7A
8B1
8B2
GND
8
9
7B1
7B2
8A
10
11
12
13
14
15
16
17
18
19
20
GND
V
V
CC
CC
9A
10B1
10B2
11A
9B1
9B2
10A
11B1
11B2
12A
Two select (SEL1 and SEL2) inputs control the
dataflow. WhentheTESTinputsareasserted, the
A port is connected to both the B1 and the B2
ports. SEL1, SEL2, and the TEST inputs can be
driven with a 5-V CMOS, a 5-V TTL, or a
low-voltage TTL driver.
12B1
12B2
13A 21
14B1 22
14B2 23
15A 24
36 13B1
35 13B2
34 14A
The device is specified by design not to have
through current when switching directions.
33 15B1
32 15B2
16B1 25
The SN74CBT16233 is characterized for
operation from 0°C to 70°C.
26
27
28
31
30
29
16B2
TEST1
TEST2
16A
SEL1
SEL2
FUNCTION TABLE
(each multiplexer/demultiplexer)
INPUTS
FUNCTION
SEL TEST
L
H
X
L
L
A = B1
A = B2
H
A = B1 and A = B2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 1998, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
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