Datasheet > SN54ALS01_08

SN54ALS01_08

更新时间： 2024-10-01 02:58:43

品牌	Logo	应用领域
德州仪器 - TI		输入元件输出元件
页数	文件大小	规格书
3页	45K
描述
QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUTS

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SN54ALS01_08 数据手册

SN54ALS01, SN74ALS01

QUADRUPLE 2-INPUT POSITIVE-NAND GATES

WITH OPEN-COLLECTOR OUTPUTS

SDAS188 – D2661, APRIL 1982 – REVISED MAY 1986

• Package Options Include Plastic Small

Outline Packages, Ceramic Chip Carriers,

and Standard Plastic and Ceramic 300-mil

DIPs

SN54ALS01 . . . J PACKAGE

SN74ALS01 . . . D OR N PACKAGE

(TOP VIEW)

• Dependable Texas Instruments Quality and

Reliability

description

These devices contain four independent 2-input

NAND gates. They perform the Boolean functions

Y = A•B or Y = A+B in positive logic. The

open-collector outputs require pullup resistors to

performcorrectly. Theymaybeconnectedtoother

open-collector outputs to implement active-low

wired-OR or active-high wired-AND functions.

Open-collector devices are often used to generate

GND

SN54ALS01 . . . FK PACKAGE

(TOP VIEW)

higher V

levels.

20 19

The SN54ALS01 is characterized for operation

over the full military temperature range of –55°C

to 125°C. The SN74ALS01 is characterized for

operation from 0°C to 70°C.

FUNCTION TABLE

(each gate)

9 10 11 12 13

INPUTS

OUTPUT

NC–No internal connection

†

logic symbol

logic diagram (positive logic)

†

This symbol is in accordance with ANSI/IEEE Std 91-1984 and

IEC Publication 617-12.

Pin numbers shown are for D, J, and N packages.

5BASIC

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

12 3

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