R&E International
A Subsidiary of Microchip Technology Inc.
RE46C126
CMOS Ionization Smoke Detector ASIC with Interconnect
Product Specification
Features
General Description
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Guard Outputs for Ion Detector Input
The RE46C126 is low power CMOS ionization type
smoke detector IC. With few external components this
circuit will provide all the required features for an
ionization type smoke detector.
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+/-0.75pA Detect Input Current
Internal Reverse Battery Protection
Internal Low Battery Detection
Low Quiescent Current Consumption (<6.5uA)
Available in 16L PDIP or 16L N SOIC
ESD Protection on all Pins
Interconnect up to 40 Detectors
Compatible with MC14468
UL Recognized per File S24036
Available in Standard Packaging or RoHS
Complaint Pb Free Packaging
An internal oscillator strobes power to the smoke
detection circuitry for 10.5mS every 1.66 seconds to
keep standby current to a minimum. A check for a low
battery condition is performed every 40 seconds when
in standby. A 2/3 duty cycle continuous horn pattern is
used for the alarm condition.
An interconnect pin allows multiple detectors to be
connected such that when one unit alarms all units will
sound.
Pin Configuration
Although this device was designed for smoke detection
utilizing an ionization chamber it can be used in a
variety of security applications.
DETCOMP
IO
GUARD2
DETECT
GUARD1
VSEN
OSCAP
HS
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
LBADJ
STROBE
The RE46C126 is recognized by Underwriters
Laboratories for use in smoke detectors that comply
with specification UL217 and UL268.
LED
VDD
RBIAS
HB
VSS
FEED
ABSOLUTE MAXIMUM RATINGS
PARAMETER
SYMBOL
VDD
Vin
VALUE
15
-.3 to Vdd +.3
-10 to +22
-.3 to 17
5
UNITS
Supply Voltage
V
V
V
V
S
Input Voltage Range Except FEED, IO
FEED Input Voltage Range
IO Input Voltage Range
Reverse Battery Time
Vinfd
Vio1
TRB
Input Current except FEED
Operating Temperature
Storage Temperature
Iin
TA
TSTG
TJ
10
mA
°C
°C
°C
-10 to 60
-55 to 125
150
Maximum Junction Temperature
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are
stress ratings only and operation at these conditions for extended periods may affect device reliability.
This product utilizes CMOS technology with static protection; however proper ESD prevention procedures should be used
when handling this product. Damage can occur when exposed to extremely high static electrical charge
© 2009 Microchip Technology Inc.
DS22170B-page 1