R&E International
A Subsidiary of Microchip Technology Inc.
RE46C141
CMOS Photoelectric Smoke Detector ASIC with Interconnect
Product Specification
Features
General Description
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Internal Power On Reset
The RE46C141 is low power CMOS photoelectric type
smoke detector IC. With minimal external components
this circuit will provide all the required features for a
photoelectric type smoke detector.
Low Quiescent Current Consumption
Available in 16L PDIP, 16L N SOIC or 16L W SOIC
ESD Protection on all Pins
Interconnect up to 40 Detectors
Temporal Horn Pattern
Low Battery and Chamber Test
Compatible with Motorola MC145012
UL Recognized per File S24036
Available in Standard Packaging or RoHS
Compliant Pb Free Packaging.
The design incorporates a gain selectable photo
amplifier for use with an infrared emitter/detector pair.
An internal oscillator strobes power to the smoke
detection circuitry for 100us every 8.1 seconds to keep
standby current to a minimum. If smoke is sensed the
detection rate is increased to verify an alarm condition.
A high gain mode is available for push button chamber
testing.
Pin Configuration
A check for a low battery condition and chamber
integrity is performed every 32 seconds when in
standby. The temporal horn pattern supports the NFPA
72 emergency evacuation signal.
TEST
LBSET
VSS
C1
C2
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
DETECT
STROBE
An interconnect pin allows multiple detectors to be
connected such that when one units alarms, all units
will sound.
ROSC
COSC
LED
VDD
The RE46C141 is recognized by Underwriters
Laboratories for use in smoke detectors that comply
with specification UL217 and UL268.
IRED
IO
FEED
HORNS
HORNB
ABSOLUTE MAXIMUM RATINGS
PARAMETER
SYMBOL
VALUE
12.5
-.3 to Vdd +.3
-10 to +22
-.3 to 17
10
-25 to 75
-55 to 125
150
UNITS
Supply Voltage
VDD
Vin
Vinfd
Vio1
Iin
TA
TSTG
TJ
V
V
V
Input Voltage Range Except FEED, IO
FEED Input Voltage Range
IO Input Voltage Range
Input Current except FEED
Operating Temperature
Storage Temperature
Maximum Junction Temperature
V
mA
°C
°C
°C
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are
stress ratings only and operation at these conditions for extended periods may affect device reliability.
This product utilizes CMOS technology with static protection; however proper ESD prevention procedures should be used when
handling this product. Damage can occur when exposed to extremely high static electrical charge.
© 2009 Microchip Technology Inc.
DS22177B-page 1