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PXIE-5450 PDF预览

PXIE-5450

更新时间: 2024-09-20 06:06:07
品牌 Logo 应用领域
美国国家仪器公司 - NI /
页数 文件大小 规格书
6页 448K
描述
Dual-channel, differential I/Q signal generation

PXIE-5450 数据手册

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400 MS/s, 16-Bit I/Q Signal Generator  
NI PXIe-5450 NEW!  
• Dual-channel, differential I/Q  
signal generation  
Operating Systems  
• Windows Vista/XP/2000  
• 16-bit resolution, 400 MS/s  
sampling rate per channel  
• 98 dB close-in SFDR at 1 MHz  
• 145 MHz analog bandwidth for  
generating 290 MHz bandwidth RF signals  
Recommended Software  
• LabVIEW  
• LabWindows/CVI  
• LabVIEW SignalExpress  
• Measurement Studio  
0.15 dB flatness to 120 MHz with  
digital flatness correction  
Included Software  
• NI-FGEN driver  
• 25 ps channel-to-channel skew  
• <-140 dBc/Hz phase noise density for  
10 MHz tone (1 kHz offset)  
• -160 dBm/Hz average noise density  
• 128 or 512 MB of deep  
onboard memory  
• NI-FGEN Express VIs  
• NI Modulation Toolkit  
• NI Analog Waveform Editor  
• FGEN Soft Front Panel  
• LabVIEW Real-Time driver  
• Continuous data streaming  
>600 MB/s from host  
Calibration  
• 1 Vpk-pk output, 2 PXI slots  
• Self-calibration with gain and channel  
alignment; offset correction  
• 1-year external calibration cycle  
Overview  
Signal Quality  
The NI PXIe-5450 is a 16-bit, 400 MS/s, dual-channel arbitrary waveform With 16 bits of resolution, the NI PXIe-5450 achieves a close-in SFDR  
generator optimized for I/Q communications signals. Each of the differential  
(without harmonics) of 98 dB at 1 MHz. Including harmonics and  
outputs features 98 dB of close-in spurious-free dynamic range (SFDR) at measured from DC to 200 MHz, it achieves a 1 MHz SFDR of 75 dB and  
1 MHz (without harmonics), better than -140 dBc/Hz phase noise density  
at 10 MHz (1 kHz offset), and less than 25 ps channel-to-channel skew.  
The NI PXIe-5450 is the ideal instrument to test devices with I/Q inputs  
or to serve as the baseband component of an RF vector signal generator.  
It also features onboard signal processing (OSP) functions that include  
pulse shaping and interpolation filters, gain and offset control, and a  
numerically controlled oscillator (NCO) for frequency shifting. Common  
applications include prototyping, validating, and testing of semiconductor  
components and communications, radar, and electronic warfare systems.  
With its NI Synchronization and Memory Core (SMC) architecture, the  
NI PXIe-5450 helps you integrate mixed-signal test systems by enabling  
synchronization with other instruments such as vector signal analyzers/  
generators, high-speed digitizers, digital waveform analyzers/generators,  
and other signal generators. You can also synchronize multiple arbitrary  
waveform generators to form a phase-coherent multichannel generator  
for applications such as MIMO (multiple-input, multiple-output) or  
beamforming antenna schemes.  
a wideband SFDR of 70 dB at 60 MHz. This ensures the dynamic range  
and out-of-band performance needed to meet the stringent demands of  
baseband I/Q signal generation (Figure 1).  
Figure 1. With its high sample rate and resolution, the NI PXIe-5450 generates  
low-distortion, high-SFDR signals over a very high bandwidth (the noise floor is  
limited by the measurement device).  

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