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NUF2042XV6 PDF预览

NUF2042XV6

更新时间: 2024-11-24 03:45:47
品牌 Logo 应用领域
安森美 - ONSEMI /
页数 文件大小 规格书
6页 57K
描述
USB Upstream Terminator with ESD Protection

NUF2042XV6 数据手册

 浏览型号NUF2042XV6的Datasheet PDF文件第2页浏览型号NUF2042XV6的Datasheet PDF文件第3页浏览型号NUF2042XV6的Datasheet PDF文件第4页浏览型号NUF2042XV6的Datasheet PDF文件第5页浏览型号NUF2042XV6的Datasheet PDF文件第6页 
NUF2030XV6, NUF2042XV6  
USB Upstream Terminator  
with ESD Protection  
These devices are designed for applications requiring Line  
Termination, EMI Filtering and ESD Protection. They are intended  
for use in upstream USB ports, cellular phones, wireless equipment  
and computer applications. These devices offer an integrated solution  
in a small package (SOT−563) reducing PCB space and cost.  
http://onsemi.com  
CIRCUIT DESCRIPTION  
Features:  
D
V
D
2(0)  
Provides USB Line Termination, Filtering and ESD Protection  
Single IC Offers Cost Savings  
1(0)  
BUS  
6
5
4
Bidirectional EMI Filtering Prevents Noise from Entering/Leaving  
the System  
Compliance with IEC61000−4−2 (Level 4)  
R
S
R
S
8 kV (Contact)  
C
1
C
1
15 kV (Air)  
ESD Ratings: Machine Model = C  
:
Human Body Model = 3B  
1
2
3
These are Pb−Free Devices  
Benefits:  
D
1(i)  
GND  
D
2(i)  
SOT−563 Package Minimizes PCB Space  
Integrated Circuit Increases System Reliability versus Discrete  
Component Implementation  
6
TVs Devices Provide ESD Protection That is Better than a Discrete  
Implementation because the Small IC minimizes Parasitic  
Inductances  
1
SOT−563  
CASE 463A  
Typical Applications:  
USB Hubs  
Computer Peripherals Using USB  
MARKING DIAGRAM  
MAXIMUM RATINGS (T = 25°C)  
A
Rating  
Steady State Power  
Symbol  
Value  
225  
Unit  
mW  
°C  
xx M G  
P
D
G
1
Maximum Junction Temperature  
Operating Temperature Range  
Storage Temperature Range  
T
125  
J(max)  
xx = Specific Device Code  
(see table on page 5)  
= Month Code  
= Pb−Free Package  
(Note: Microdot may be in either location)  
T
−55 to +125  
−55 to +125  
260  
°C  
J
T
stg  
°C  
M
G
Lead Solder Temperature  
(10 second duration)  
T
°C  
L
Maximum ratings are those values beyond which device damage can occur.  
Maximum ratings applied to the device are individual stress limit values (not  
normal operating conditions) and are not valid simultaneously. If these limits are  
exceeded, device functional operation is not implied, damage may occur and  
reliability may be affected.  
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 5 of this data sheet.  
©
Semiconductor Components Industries, LLC, 2005  
1
Publication Order Number:  
July, 2005 − Rev. 2  
NUF2030XV6/D  

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